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ADMP504ACEZ-RL Datasheet(PDF) 10 Page - Analog Devices |
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ADMP504ACEZ-RL Datasheet(HTML) 10 Page - Analog Devices |
10 / 12 page ADMP504 Data Sheet Rev. 0 | Page 10 of 12 RELIABILITY SPECIFICATIONS The microphone sensitivity after stress must deviate by no more than 3 dB from the initial value. Table 5. Stress Test Description Low Temperature Operating Life −40°C, 1000 hrs, powered High Temperature Operating Life +125°C, 1000 hrs, powered Temperature Humidity Bias (THB) +85°C/+85% relative humidity (RH), 1000 hrs, powered Temperature Cycle −40°C/+125°C, one cycle per hour, 1000 cycles High Temperature Storage +150°C, 1000 hrs Low Temperature Storage −40°C, 1000 hrs Component CDM ESD All pins, 0.5 kV Component HBM ESD All pins, 1.5 kV Component MM ESD All pins, 0.2 kV |
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