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ADUCM361 Datasheet(PDF) 9 Page - Analog Devices

Part # ADUCM361
Description  Low Power Precision Analog Microcontroller
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADUCM361 Datasheet(HTML) 9 Page - Analog Devices

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Preliminary Technical Data
ADuCM360/ADuCM361
Rev. Pr R| Page 9 of 21
Parameter
Test Conditions/Comments
Min
Typ
Max
Unit
From MCU Power-Down
(mode 1, 2 and 3)
Fclk is the Cortex-M3 core clock
3-5 x Fclk
From TOTAL-HALT or
HIBERNATE (mode 4 or mode
5) mode
30.8
μs
POWER REQUIREMENTS
Power Supply Voltages
VDD
1.8
3.6
V
Power Consumption
IDD (MCU Active Mode)14,15
MCU clock rate = 16 MHz, all
peripherals on
5.5
mA
MCU clock rate = 500 KHz, Both
ADCs on (Input buffers off) with
PGAs Gain = 4, 1 x SPI on, all
timers on
1
mA
IDD (MCU Powered Down)1
Full temperature range
HIBERNATE (mode 5)
4
10
μA
Reduced temperature range
−40°C to +85°C
2
5
μA
IDD (Primary ADC) (total)15
PGA enabled – total, G>=32
320
μA
PGA
G=4/8/16 – PGA only
130
μA
G=32/64/128 – PGA only
180
Input Buffers
2 x Input buffers is 70uA
70
μA
Digital Interface +
Modulator
70
μA
IDD (Auxiliary ADC)
Input buffers off, G=4/8/16 only
200
μA
External Reference Input
buffers
60uA each
120
μA
1
These numbers are not production tested but are guaranteed by design and/or characterization data at production release.
2
Tested at gain range = 4 after initial offset calibration.
3
Measured with an internal short. A system zero-scale calibration removes this error.
4
A recalibration at any temperature removes these errors.
5
These numbers do not include internal reference temperature drift.
6
Factory calibrated at gain = 1.
7
System calibration at a specific gain range removes the error at this gain range.
8
Measured using the box method.
9
Input current measured with one ADC measuring a channel. If both ADCs measure the same input channel, then the input current will increase – approximately
double
10
Reference DAC linearity is calculated using a reduced code range of 0x0AB to 0xF30.
11
Endurance is qualified to 20,000 cycles as per JEDEC Std. 22 Method A117 and measured at −40°C, +25°C, and +125°C. Typical endurance at 25°C is 170,000 cycles.
12
Retention lifetime equivalent at junction temperature (TJ) = 85°C as per JEDEC Std. 22 Method A117. Retention lifetime derates with junction temperature.
13
Voltage input levels only relevant if driving XTAL input from a voltage source. If a crystal is connected directly, the internal crystal interface will determine the
common mode voltage.
14
Typical additional supply current consumed during Flash/EE memory program and erase cycles is 7mA.
15
Total IDD for ADC includes figures for PGA≥32, input buffers, digital interface and the Sigma Delta modulator.


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