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ADUCM361 Datasheet(PDF) 9 Page - Analog Devices |
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ADUCM361 Datasheet(HTML) 9 Page - Analog Devices |
9 / 21 page Preliminary Technical Data ADuCM360/ADuCM361 Rev. Pr R| Page 9 of 21 Parameter Test Conditions/Comments Min Typ Max Unit From MCU Power-Down (mode 1, 2 and 3) Fclk is the Cortex-M3 core clock 3-5 x Fclk From TOTAL-HALT or HIBERNATE (mode 4 or mode 5) mode 30.8 μs POWER REQUIREMENTS Power Supply Voltages VDD 1.8 3.6 V Power Consumption IDD (MCU Active Mode)14,15 MCU clock rate = 16 MHz, all peripherals on 5.5 mA MCU clock rate = 500 KHz, Both ADCs on (Input buffers off) with PGAs Gain = 4, 1 x SPI on, all timers on 1 mA IDD (MCU Powered Down)1 Full temperature range HIBERNATE (mode 5) 4 10 μA Reduced temperature range −40°C to +85°C 2 5 μA IDD (Primary ADC) (total)15 PGA enabled – total, G>=32 320 μA PGA G=4/8/16 – PGA only 130 μA G=32/64/128 – PGA only 180 Input Buffers 2 x Input buffers is 70uA 70 μA Digital Interface + Modulator 70 μA IDD (Auxiliary ADC) Input buffers off, G=4/8/16 only 200 μA External Reference Input buffers 60uA each 120 μA 1 These numbers are not production tested but are guaranteed by design and/or characterization data at production release. 2 Tested at gain range = 4 after initial offset calibration. 3 Measured with an internal short. A system zero-scale calibration removes this error. 4 A recalibration at any temperature removes these errors. 5 These numbers do not include internal reference temperature drift. 6 Factory calibrated at gain = 1. 7 System calibration at a specific gain range removes the error at this gain range. 8 Measured using the box method. 9 Input current measured with one ADC measuring a channel. If both ADCs measure the same input channel, then the input current will increase – approximately double 10 Reference DAC linearity is calculated using a reduced code range of 0x0AB to 0xF30. 11 Endurance is qualified to 20,000 cycles as per JEDEC Std. 22 Method A117 and measured at −40°C, +25°C, and +125°C. Typical endurance at 25°C is 170,000 cycles. 12 Retention lifetime equivalent at junction temperature (TJ) = 85°C as per JEDEC Std. 22 Method A117. Retention lifetime derates with junction temperature. 13 Voltage input levels only relevant if driving XTAL input from a voltage source. If a crystal is connected directly, the internal crystal interface will determine the common mode voltage. 14 Typical additional supply current consumed during Flash/EE memory program and erase cycles is 7mA. 15 Total IDD for ADC includes figures for PGA≥32, input buffers, digital interface and the Sigma Delta modulator. |
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