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THS4531IRUNR Datasheet(PDF) 3 Page - Texas Instruments

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Part # THS4531IRUNR
Description  Ultra Low Power, Rail-to-Rail Output, Fully-Differential Amplifier
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

THS4531IRUNR Datasheet(HTML) 3 Page - Texas Instruments

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THS4531
www.ti.com
SLOS358B – SEPTEMBER 2011 – REVISED MARCH 2012
ELECTRICAL CHARACTERISTICS: VS = 2.7 V
Test conditions at TA = 25°C, VS+ = 2.7 V, VS– = 0 V, VOCM = open, VOUT = 2 VPP, RF = 2 kΩ, RL = 2 kΩ differential, G = 1 V/V,
single-ended input, differential output, and input and output referenced to mid-supply, unless otherwise noted.
TEST
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
LEVEL(1)
AC PERFORMANCE
VOUT = 100 mVPP, G = 1
34
VOUT = 100 mVPP, G = 2
16
Small-signal bandwidth
MHz
VOUT = 100 mVPP, G = 5
6
VOUT = 100 mVPP, G = 10
2.7
Gain-bandwidth product
VOUT = 100 mVPP, G = 10
27
MHz
Large-signal bandwidth
VOUT = 2 VPP, G = 1
34
MHz
Bandwidth for 0.1-dB flatness
VOUT = 2 VPP, G = 1
12
MHz
Slew rate, rise/fall, 25% to 75%
190/320
V/µs
Rise/fall time, 10% to 90%
5.2/6.1
ns
Settling time to 1%, rise/fall
25/20
VOUT = 2-V step
ns
Settling time to 0.1%, rise/fall
60/60
Settling time to 0.01%, rise/fall
150/110
ns
Overshoot/undershoot, rise/fall
1/1
%
f = 1 kHz, VOUT = 1 VRMS
–122
C
2nd-order harmonic distortion
f = 10 kHz
–127
dBc
f = 1 MHz
–59
f = 1 kHz, VOUT = 1 VRMS
–130
3rd-order harmonic distortion
f = 10 kHz
–135
dBc
f = 1 MHz
–70
2nd-order intermodulation
–83
f = 1 MHz, 200-Hz tone spacing,
distortion
dBc
VOUT envelope = 1 VPP
3rd-order intermodulation distortion
–81
Input voltage noise
f = 1 kHz
10
nV/
√Hz
Voltage noise 1/f corner frequency
45
Hz
Input current noise
f = 100 kHz
0.25
pA/
√Hz
Current noise 1/f corner frequency
6.5
kHz
Overdrive recovery time
Overdrive = 0.5 V
65
ns
Output balance error
VOUT = 100 mV, f = 1 MHz
–65
dB
Closed-loop output impedance
f = 1 MHz (differential)
2.5
Ω
(1)
Test levels (all values set by characterization and simulation): (A) 100% tested at +25°C; over temperature limits by characterization and
simulation. (B) Not tested in production; limits set by characterization and simulation. (C) Typical value only for information.
Copyright © 2011–2012, Texas Instruments Incorporated
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