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BQ76PL536A-Q1 Datasheet(PDF) 3 Page - Texas Instruments

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Part # BQ76PL536A-Q1
Description  3 to 6 Series Cell Lithium-Ion Battery Monitor and Secondary Protection IC for EV and HEV Applications
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

BQ76PL536A-Q1 Datasheet(HTML) 3 Page - Texas Instruments

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bq76PL536A-Q1
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SLUSAM3
– MAY 2011
PIN
TYPE(1)
DESCRIPTION
NAME
NO.
BAT2
64
P
Power-supply voltage, connect to most-positive cell +, tie to BAT1 on PCB
CB1
12
O
Cell-balance control output
CB2
10
O
Cell-balance control output
CB3
8
O
Cell-balance control output
CB4
6
O
Cell-balance control output
CB5
4
O
Cell-balance control output
CB6
2
O
Cell-balance control output
CONV_H
36
I
Host-to-device interface
– initiates a synchronous conversion. Pin has 250-nA internal sink to VSS.
CONV_N
59
OD
Current-mode output to the next-higher bq76PL536A-Q1 to initiate a conversion
CONV_S
21
I
Input from the adjacent lower bq76PL536A-Q1 to initiate a conversion
CS_H
43
I
Host-to-device interface
– active-low chip select from host. Internal 100-kΩ pullup resistor
CS_N
52
OD
Current-mode output used to select the next-higher bq76PL536A-Q1 for SPI communication
CS_S
29
I
Current-mode input SPI chip-select (slave-select) from the next-lower bq76PL536A-Q1
DRDY_H
37
O
Host-to-device interface
– conversion complete, data-ready indication
DRDY_N
58
I
Current-mode input indicating conversion data is ready from next-higher bq76PL536A-Q1
DRDY_S
22
OD
Current-mode output indicating conversion data is ready to the next lower bq76PL536A-Q1
FAULT_H
39
O
Host-to-device interface
– FAULT condition detected in this or higher (North) device
FAULT_N
56
I
Current-mode input indicating a system status change from the next-higher bq76PL536A-Q1
FAULT_S
24
OD
Current-mode output
GPAI+
48
AI
General-purpose (differential) analog input, connect to VSS if unused.
GPAI
47
AI
General-purpose (differential) analog input, connect to VSS if unused.
GPIO
45
IOD
Digital open-drain I/O. A 10-k
Ω to 2-MΩ pullup is recommended.
HSEL
44
I
Host interface enable, 0 = enable, 1 = disable
LDOA
17
P
Internal analog 5-V LDO bypass connection, requires 2.2-
µF ceramic capacitor for stability
LDOD1
18
P
Internal digital 5-V LDO bypass connection 1, requires 2.2-
µF ceramic capacitor for stability. This pin is tied
internally to LDOD2. This pin should be tied to LDOD2 externally.
LDOD2
46
P
Internal digital 5-V LDO bypass connection 2, requires 2.2-
µF ceramic capacitor for stability. This pin is tied
internally to LDOD1. This pin should be tied to LDOD1 externally.
NC30
30
No connection
NC51
51
No connect
NC62
62
No connect
REG50
32
P
5-V user LDO output, requires 2.2-
µF ceramic capacitor for stability
SCLK_H
40
I
Host-to-device interface
– SPI clock from host
SCLK_N
55
OD
Current-mode output SPI clock to the next-higher bq76PL536A-Q1
SCLK_S
26
I
Current-mode input SPI clock from the next-lower bq76PL536A-Q1
SDI_H
42
I
Host-to-device interface
– data from host to device (host MOSI signal)
SDI_N
53
OD
Current-mode output for SPI data to the next-higher bq76PL536A-Q1
SDI_S
28
I
Current-mode input for SPI data from the next-lower bq76PL536A-Q1
SDO_H
41
O
Host-to-device interface
– data from device to host (host MISO signal), 3-state pin, 250-nA internal pullup
SDO_N
54
I
Current-mode input for SPI data from the next-lower bq76PL536A-Q1
SDO_S
27
OD
Current-mode output for SPI data to the next-lower bq76PL536A-Q1
TEST
50
I
Factory test pin. Connect to VSS in user circuitry. This pin includes ~100-k
Ω internal pulldown
TS1+
20
AI
Differential temperature sensor input
TS1
19
AI
Differential temperature sensor input
TS2+
61
AI
Differential temperature sensor input
TS2
60
AI
Differential temperature sensor input
VC0
13
AI
Sense-voltage input terminal for negative terminal of first cell (VSS)
VC1
11
AI
Sense voltage input terminal for positive terminal of the first cell
Copyright
© 2011, Texas Instruments Incorporated
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