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bq27541DRZT-G1 Datasheet(PDF) 5 Page - Texas Instruments |
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bq27541DRZT-G1 Datasheet(HTML) 5 Page - Texas Instruments |
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5 / 46 page  bq27541-G1 www.ti.com SLUSAL6B – NOVEMBER 2011 – REVISED JUNE 2012 HIGH FREQUENCY OSCILLATOR TA = –40°C to 85°C, C(REG) = 0.47μF, 2.45 V < V(REGIN) = VBAT < 5.5 V; typical values at TA = 25°C and V(REGIN) = VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT f(OSC) Operating frequency 2.097 MHz TA = 0°C to 60°C –2.0% 0.38% 2.0% f(EIO) Frequency error(1) (2) TA = –20°C to 70°C –3.0% 0.38% 3.0% TA = –40°C to 85°C -4.5% 0.38% 4.5% t(SXO) Start-up time(3) 2.5 5 ms (1) The frequency error is measured from 2.097 MHz. (2) The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C. (3) The startup time is defined as the time it takes for the oscillator output frequency to be ±3%. LOW FREQUENCY OSCILLATOR TA = –40°C to 85°C, C(REG) = 0.47μF, 2.45 V < V(REGIN) = VBAT < 5.5 V; typical values at TA = 25°C and V(REGIN) = VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT f(LOSC) Operating frequency 32.768 KHz TA = 0°C to 60°C –1.5% 0.25% 1.5% f(LEIO) Frequency error(1) (2) TA = –20°C to 70°C –2.5% 0.25% 2.5% TA = –40°C to 85°C -4.0% 0.25% 4.0% t(LSXO) Start-up time(3) 500 μs (1) The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C. (2) The frequency error is measured from 32.768 KHz. (3) The startup time is defined as the time it takes for the oscillator output frequency to be ±3% of typical oscillator frequency. INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS TA = –40°C to 85°C, C(REG) = 0.47μF, 2.45 V < V(REGIN) = VBAT < 5.5 V; typical values at TA = 25°C and V(REGIN) = VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIN(SR) Input voltage range, V(SRN) and V(SRP) VSR = V(SRN) – V(SRP) –0.125 0.125 V tCONV(SR) Conversion time Single conversion 1 s Resolution 14 15 bits VOS(SR) Input offset 10 μV INL Integral nonlinearity error ±0.007 ±0.034 FSR ZIN(SR) Effective input resistance(1) 2.5 M Ω Ilkg(SR) Input leakage current(1) 0.3 μA (1) Specified by design. Not production tested. ADC (TEMPERATURE AND CELL VOLTAGE) CHARACTERISTICS TA = –40°C to 85°C, C(REG) = 0.47μF, 2.45 V < V(REGIN) = VBAT < 5.5 V; typical values at TA = 25°C and V(REGIN) = VBAT = 3.6 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIN(ADC) Input voltage range –0.2 1 V tCONV(ADC) Conversion time 125 ms Resolution 14 15 bits VOS(ADC) Input offset 1 mV Z(ADC1) Effective input resistance (TS) (1) 8 M Ω bq27541-G1 not measuring cell voltage 8 M Ω Z(ADC2) Effective input resistance (BAT)(1) bq27541-G1 measuring cell voltage 100 k Ω (1) Specified by design. Not production tested. Copyright © 2011–2012, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Link(s): bq27541-G1 |
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