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DAC1282IPWR Datasheet(PDF) 2 Page - Texas Instruments |
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DAC1282IPWR Datasheet(HTML) 2 Page - Texas Instruments |
2 / 43 page DAC1282 SBAS490 – DECEMBER 2011 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. RELATED PRODUCTS DESCRIPTION DEVICE High-resolution ADC ADS1281 High-resolution ADC with PGA ADS1282 Low-drift 5 V reference REF5050 ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range, unless otherwise noted. DAC1282 MIN MAX UNIT AVDD to AVSS –0.3 +5.5 V AVSS to DGND –2.8 +0.3 V DVDD to DGND –0.3 +3.6 V Input current continuous –10 +10 mA Analog input/output voltage AVSS – 0.3 AVDD + 0.3 V Switch current –60 +60 mA Digital input voltage to DGND –0.3 DVDD + 0.3 V Operating temperature range –50 +125 °C Storage temperature range –60 +150 °C JEDEC standard 22, test V Human body model (HBM) ±2000 method A114-C.01, all pins ESD ratings JEDEC standard 22, test V Charge device model (CDM) ±500 method C101, all pins (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. 2 Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s): DAC1282 |
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