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TPS57160-Q1 Datasheet(PDF) 2 Page - Texas Instruments |
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TPS57160-Q1 Datasheet(HTML) 2 Page - Texas Instruments |
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2 / 54 page  TPS57160-Q1 SLVSAP1C – DECEMBER 2010 – REVISED AUGUST 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) TJ PACKAGE(2) ORDERABLE PART NUMBER TOP-SIDE MARKING MSOP – DGQ Reel of 2500 TPS57160QDGQRQ1 5716Q –40°C to 150°C SON – DRC Reel of 3000 TPS57160QDRCRQ1 5716Q (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. ABSOLUTE MAXIMUM RATINGS (1) over operating temperature range (unless otherwise noted) VALUE VIN –0.3 V to 65 V EN(2) –0.3 V to 5 V BOOT 73 V VSENSE –0.3 V to 3 V VIN Input voltage COMP –0.3 V to 3 V PWRGD –0.3 V to 6 V SS/TR –0.3 V to 3 V RT/CLK –0.3 V to 3.6 V BOOT to PH 8 V –0.6 V to 65 V VOUT Output voltage 200 ns –1 V to 65 V PH 30 ns –2 V to 65 V Maximum dc voltage, TJ = -40°C –0.85 V VDIFF Differential voltage PAD to GND ±200 mV EN 100 μA BOOT 100 mA ISOURCE Source current VSENSE 10 μA PH Current Limit RT/CLK 100 μA VIN Current Limit COMP 100 μA ISINK Sink current PWRGD 10 mA SS/TR 200 μA TJ Operating junction temperature range –40°C to 150°C TSTG Storage temperature range –65°C to 150°C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure beyond absolute maximum rated conditions for extended periods may affect device reliability. (2) See Enable and Adjusting Undervoltage Lockout for details. 2 Copyright © 2010–2012, Texas Instruments Incorporated |
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