BUCK1

BUCK2

BUCK3

CLOCK

ROSC

USB_SWITCH

+

PG&RST

generator

PGOOD

12V

for sequenced

start-up

External enable

External enable

External enable

for sequenced

start-up

for sequenced

start-up

+

Low Power mode

Low Power mode

Low Power mode

USB supply

Biasing

-

+

PB_IN

Debounce

P_OFF

0.8V

0.8V

0.8V

1µA

1µA

1µA

INT

F_PWM

High for forced PWM

Low por autoamtic PFM/PWM mode

V3V

TPS65257

www.ti.com

SLVSB32

– SEPTEMBER 2011

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

FUNCTIONAL BLOCK DIAGRAM

Copyright

© 2011, Texas Instruments Incorporated

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