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TPS92510DGQ Datasheet(PDF) 2 Page - Texas Instruments

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Part # TPS92510DGQ
Description  1.5-A Constant-Current Buck Converter for High-Brightness LEDs with Integrated LED Thermal Foldback
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

TPS92510DGQ Datasheet(HTML) 2 Page - Texas Instruments

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TPS92510
SLUSAE4A – JANUARY 2012 – REVISED JUNE 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
ORDERABLE DEVICE
TJ
PACKAGE
PINS
OUTPUT SUPPLY
MINIMUM QUANTITY
NUMBER
Tube
80
TPS92510DGQ
PowerPAD Plastic
–40°C to 150°C
10
Small Outline (MSOP)
Tape and Reel
2500
TPS92510DGQR
(1)
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating temperature range (unless otherwise noted).
VALUE
UNIT
MIN
MAX
VIN
–0.3
65
PDIM, EN
–0.3
6
Input voltage
BOOT
73
V
VSENSE, TSENSE, COMP
–0.3
3
RT/CLK
–0.3
3.6
BOOT-PH
8
Output voltage
PH
–0.6
65
V
PH, 10-ns Transient
–2
65
Voltage Difference
PAD to GND
±200
mV
EN
100
μA
BOOT
100
mA
VSENSE
10
μA
Source current
Current
PH
A
Limit
RT/CLK
100
μA
Current
VIN
A
Limit
Sink current
COMP, VSENSE, EN
100
μA
Electrostatic Discharge (HBM) QSS 009-105 (JESD22-A114A)
2
kV
Electrostatic Discharge (CDM) QSS 009-147 (JESD22-C101B.01)
500
V
Operating junction temperature, TJ
–40
150
°C
Storage temperature, Tstg
–65
150
°C
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2
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Copyright © 2012, Texas Instruments Incorporated
Product Folder Link(s): TPS92510


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