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ADS1148IRHBT Datasheet(PDF) 2 Page - Texas Instruments |
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ADS1148IRHBT Datasheet(HTML) 2 Page - Texas Instruments |
2 / 64 page ADS1146 ADS1147 ADS1148 SBAS453F – JULY 2009 – REVISED APRIL 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1) DUAL SENSOR EXCITATION NUMBER OF VOLTAGE CURRENT PACKAGE- PRODUCT RESOLUTION INPUTS REFERENCE SOURCES LEAD 1 Differential ADS1246 24 bits or External NO TSSOP-16 1 Single-Ended 2 Differential ADS1247 24 bits or Internal or External YES TSSOP-20 3 Single-Ended 4 Differential ADS1248 24 bits or Internal or External YES TSSOP-28 7 Single-Ended 1 Differential ADS1146 16 bits or External NO TSSOP-16 1 Single-Ended 2 Differential ADS1147 16 bits or Internal or External YES TSSOP-20 3 Single-Ended 4 Differential 16 bits or Internal or External YES TSSOP-28 7 Single-Ended ADS1148 4 Differential 16 bits or Internal or External YES QFN-32 7 Single-Ended (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the device product folder on www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range, unless otherwise noted. ADS1146, ADS1147, ADS1148 UNIT AVDD to AVSS –0.3 to +5.5 V AVSS to DGND –2.8 to +0.3 V DVDD to DGND –0.3 to +5.5 V 100, momentary mA Input current 10, continuous mA Analog input voltage to AVSS AVSS – 0.3 to AVDD + 0.3 V Digital input voltage to DGND –0.3 to DVDD + 0.3 V Maximum junction temperature +150 °C Operating temperature range –40 to +125 °C Storage temperature range –60 to +150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute- maximum-rated conditions for extended periods may affect device reliability. 2 Copyright © 2009–2012, Texas Instruments Incorporated |
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