Electronic Components Datasheet Search |
|
SN74BCT8373DWR Datasheet(PDF) 4 Page - Texas Instruments |
|
SN74BCT8373DWR Datasheet(HTML) 4 Page - Texas Instruments |
4 / 21 page SN74BCT8373 SCAN TEST DEVICE WITH OCTAL DTYPE LATCHES SCBS471 − JUNE 1990 − REVISED JUNE 1994 2−4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251−1443 Terminal Functions TERMINAL NAME DESCRIPTION 1D − 8D Normal-function data inputs. See function table for normal-mode logic. Internal pullups force these inputs to a high level if left unconnected. GND Ground LE Normal-function latch-enable input. See function table for normal-mode logic. An internal pullup forces LE to a high level if left unconnected. OE Normal-function output-enable input. See function table for normal-mode logic. An internal pullup forces OE to a high level if left unconnected. 1Q − 8Q Normal-function data outputs. See function table for normal-mode logic. TCK Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. An internal pullup forces TCK to a high level if left unconnected. TDI Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected. TDO Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data through the instruction register or selected data register. An internal pullup forces TDO to a high level when it is not active and is not driven from an external source. TMS Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP controller states. An internal pullup forces TMS to a high level if left unconnected. TMS also provides the optional test reset signal of IEEE Standard 1149.1-1990. This is implemented by recognizing a third logic level, double high (VIHH), at TMS. VCC Supply voltage |
Similar Part No. - SN74BCT8373DWR |
|
Similar Description - SN74BCT8373DWR |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.NET |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |