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TMS427809AP Datasheet(PDF) 4 Page - Texas Instruments |
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TMS427809AP Datasheet(HTML) 4 Page - Texas Instruments |
4 / 29 page TMS417809A, TMS427809A, TMS427809AP 2097152 BY 8-BIT EXTENDED DATA OUT DYNAMIC RANDOM-ACCESS MEMORIES SMKS894B – AUGUST 1996 – REVISED NOVEMBER 1997 4 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251–1443 write-enable ( W ) The read- or write mode is selected through W. A logic high on W selects the read mode, and a logic low selects the write mode. The data inputs are disabled when the read mode is selected. When W goes low prior to CAS (early write), data out remains in the high-impedance state for the entire cycle, permitting a write operation with OE grounded. If W goes low in an extended-data-out read cycle, the DQs are disabled as long as CAS is high (see Figure 8). data in / data out (DQ0 – DQ7) Data is written during a write- or read-modify-write cycle. Depending on the mode of operation, the latter of the falling edges of CAS or W strobes data into the on-chip data latch with setup-and-hold times referenced to the latter edge. The DQs drive valid data after all access times are met and the data remains valid except in cases described in the W and OE descriptions. RAS-only refresh A refresh operation must be performed once every 32 ms (128 ms for TMS427809AP) to retain data. This can be achieved by strobing each of the 2 048 rows (A0 – A10). A normal read- or write cycle refreshes all bits in each row that is selected. A RAS-only operation can be used by holding CAS at the high (inactive) level, conserving power as the output buffers remain in the high-impedance state. Externally generated addresses must be used for a RAS-only refresh. hidden refresh A hidden refresh can be performed while maintaining valid data at the output pin. This is accomplished by holding CAS at VIL after a read operation and cycling RAS after a specified precharge period, similar to a RAS-only refresh cycle. The external address is ignored and the refresh address is generated internally. CAS-before-RAS ( CBR ) refresh CBR refresh is performed by bringing CAS low earlier than RAS (see parameter tCSR) and holding it low after RAS falls (see parameter tCHR). For successive CBR-refresh cycles, CAS can remain low while cycling RAS. The external address is ignored and the refresh address is generated internally. battery-backup refresh TMS427809AP A low-power battery-backup refresh mode that requires less than 350 mA of refresh current is available on the TMS427809AP. Data integrity is maintained using CBR refresh with a period of 62.5 ms while holding RAS low for less than 300 ns. To minimize current consumption, all input levels must be at CMOS levels (VIL < 0.2 V, VIH >VCC – 0.2 V). self-refresh (TMS427809AP) The self-refresh mode is entered by dropping CAS low prior to RAS going low, then CAS and RAS are both held low for a minimum of 100 ms. The chip is refreshed internally by an on-board oscillator. No external address is required because the CBR counter is used to keep track of the address. To exit the self-refresh mode, both RAS and CAS are brought high to satisfy tCHS. Upon exiting self-refresh mode, a burst refresh (refreshes a full set of row addresses) must be executed before continuing with normal operation to ensure that the DRAM is fully refreshed. power up To achieve proper device operation, an initial pause of 200 µs followed by a minimum of eight initialization cycles is required after power up to the full VCC level. These eight initialization cycles must include at least one refresh ( RAS-only or CBR ) cycle. |
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