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V

CC

3

2

4

5

1

OE

Y

A

GND

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DCKPACKAGE

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DESCRIPTION/ORDERING INFORMATION

SN74AUC1G125-EP

SINGLE BUS BUFFER GATE

WITH 3-STATE OUTPUT

SCES670 – MARCH 2007

• Controlled Baseline

• I

Operation

–

One Assembly Site

• Sub-1-V Operable

–

One Test Site

• Max t

–

One Fabrication Site

• Low Power Consumption, 10-µA Max I

CC

• Extended Temperature Performance of –55°C

to 125

°C

• ±8-mA Output Drive at 1.8 V

• Enhanced Diminishing Manufacturing Sources

• Latch-Up Performance Exceeds 100 mA Per

(DMS) Support

JESD 78, Class II

• Enhanced Product-Change Notification

• ESD Protection Exceeds JESD 22

–

2000-V Human-Body Model (A114-A)

• Optimized for 1.8-V Operation and Is 3.6-V I/O

–

200-V Machine Model (A115-A)

Tolerant to Support Mixed-Mode Signal

–

1000-V Charged-Device Model (C101)

Operation

(1)

Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over an

extended temperature range. This includes, but is not limited

to, Highly Accelerated Stress Test (HAST) or biased 85/85,

temperature cycle, autoclave or unbiased HAST,

electromigration, bond intermetallic life, and mold compound

life. Such qualification testing should not be viewed as

justifying use of this component beyond specified

performance and environmental limits.

operation.

The SN74AUC1G125 is a single-line driver with a 3-state output. The output is disabled when the output-enable

(OE) input is high.

resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

preventing damaging current backflow through the device when it is powered down.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2007, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.