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SN74BCT25240 Datasheet(PDF) 1 Page - Texas Instruments |
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SN74BCT25240 Datasheet(HTML) 1 Page - Texas Instruments |
1 / 6 page SN74BCT25240 25 Ω OCTAL BUFFER/DRIVER WITH 3STATE OUTPUTS SCBS101B − JUNE 1990 − REVISED NOVEMBER 1993 Copyright 1993, Texas Instruments Incorporated 2−1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251−1443 • State-of-the-Art BiCMOS Design Significantly Reduces ICCZ • ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) • Designed to Facilitate Incident-Wave Switching for Line Impedances of 25 Ω or Greater • Distributed V CC and GND Pins Minimize Noise Generated by the Simultaneous Switching of Outputs • Package Options Include Plastic Small-Outline (DW) Packages and Standard Plastic 300-mil DIPs (NT) description This 25- Ω octal buffers and line driver is designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters. The SN74BCT25240 is capable of sinking 188-mA IOL, which facilitates switching 25-Ω transmission lines on the incident wave. The distributed VCC and GND pins minimize switching noise for more reliable system operation. When the output-enable (1OE and 2OE) inputs are low, the device transmits the inverted A-input data to the Y outputs. When 1OE and 2OE are high, the outputs are in the high-impedance state. 1OE affects only the 1Y outputs; 2OE affects only the 2Y outputs. The SN74BCT25240 is characterized for operation from 0 °C to 70°C. FUNCTION TABLE (each buffer/driver) INPUTS OUTPUT OE A OUTPUT Y L H L L LH H X Z 1 2 3 4 5 6 7 8 9 10 11 12 24 23 22 21 20 19 18 17 16 15 14 13 1Y1 GND 1Y2 1Y3 GND 1Y4 2Y1 GND 2Y2 2Y3 GND 2Y4 1OE 1A1 1A2 VCC 1A3 1A4 2A1 2A2 VCC 2A3 2A4 2OE DW OR NT PACKAGE (TOP VIEW) PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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