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LT6654 Datasheet(PDF) 6 Page - Linear Technology |
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LT6654 Datasheet(HTML) 6 Page - Linear Technology |
6 / 22 page LT6654 6 6654fc Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. Note 2: If the parts are stored outside of the specified temperature range, the output may shift due to hysteresis. Note 3: Temperature coefficient is measured by dividing the maximum change in output voltage by the specified temperature range. Note 4: Load regulation is measured on a pulse basis from no load to the specified load current. Output changes due to die temperature change must be taken into account separately. Note 5: Excludes load regulation errors. Note 6: Peak-to-peak noise is measured with a 1-pole highpass filter at 0.1Hz and 2-pole lowpass filter at 10Hz. The unit is enclosed in a still-air environment to eliminate thermocouple effects on the leads. The test time is 10 seconds. RMS noise is measured on a spectrum analyzer in a shielded environment where the intrinsic noise of the instrument is removed to determine the actual noise of the device. Note 7: Long-term stability typically has a logarithmic characteristic and therefore, changes after 1000 hours tend to be much smaller than before that time. Total drift in the second thousand hours is normally less than one third that of the first thousand hours with a continuing trend toward reduced drift with time. Long-term stability will also be affected by differential stresses between the IC and the board material created during board assembly. Note 8: Hysteresis in output voltage is created by package stress that differs depending on whether the IC was previously at a higher or lower temperature. Output voltage is always measured at 25°C, but the IC is cycled to the hot or cold temperature limit before successive measurements. Hysteresis measures the maximum output change for the averages of three hot or cold temperature cycles. For instruments that are stored at well controlled temperatures (within 20 or 30 degrees of operational temperature), it is usually not a dominant error source. Typical hysteresis is the worst-case of 25°C to cold to 25°C or 25°C to hot to 25°C, preconditioned by one thermal cycle. Note 9: The stated temperature is typical for soldering of the leads during manual rework. For detailed IR reflow recommendations, refer to the Applications Information section. PARAMETER CONDITIONS MIN TYP MAX UNITS Long-Term Drift of Output Voltage (Note 7) LT6654S6 LT6654LS8 60 15 ppm/√kHr ppm/√kHr Hysteresis (Note 8) S6 ΔT = 0°C to 70°C ΔT = –40°C to 85°C ΔT = –40°C to 125°C ΔT = –55°C to 125°C LS8 ΔT = 0°C to 70°C ΔT = –40°C to 85°C ΔT = –40°C to 125°C ΔT = –55°C to 125°C 15 30 40 50 3 11 15 20 ppm ppm ppm ppm ppm ppm ppm ppm The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C, CL = 1μF and VIN = VOUT + 0.5V, unless otherwise noted. For LT6654-1.25, VIN = 2.4V, unless otherwise noted. ELECTRICAL CHARACTERISTICS |
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