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HT56R66 Datasheet(PDF) 8 Page - Holtek Semiconductor Inc |
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HT56R66 Datasheet(HTML) 8 Page - Holtek Semiconductor Inc |
8 / 104 page Symbol Parameter Test Conditions Min. Typ. Max. Unit VDD Conditions VLVD Low Voltage Detector Voltage ¾ Configuration option: 2.2V 2.08 2.2 2.32 V Configuration option: 3.3V 3.12 3.3 3.50 V Configuration option: 4.4V 4.12 4.4 4.70 V IOL1 I/O Port Sink Current 3V VOL=0.1VDD 612 ¾ mA 5V 10 25 ¾ mA IOH1 I/O Port Source Current 3V VOH=0.9VDD -2 -4 ¾ mA 5V -5 -8 ¾ mA IOL2 LCD Common and Segment Current 3V VOL=0.1VDD 210 420 ¾mA 5V 350 700 ¾mA IOH2 LCD Common and Segment Current 3V VOH=0.9VDD -80 -160 ¾mA 5V -180 -360 ¾mA RPH Pull-high Resistance for I/O Ports 3V ¾ 20 60 100 k W 5V 10 30 50 k W Note: 1. 32768Hz is in slow start mode (RTCC.4=1) for the D.C. current measurement. 2. LCD waveform is in Type A condition. 3. fS is the internal clock for the Buzzer, RTC Interrupt, Time Base Interrupt and the WDT. 4. Both Timer/Event Counters are off. Timer filter is disabled for all test conditions. 5. All peripherals are in OFF condition if not mentioned at IDD,ISTB tests. HT56R66/HT56R666 Rev. 1.40 8 May 11, 2012 |
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