© 2009 Fairchild Semiconductor Corporation

www.fairchildsemi.com

FXLA104 • Rev. 1.0.9

4

Absolute Maximum Ratings

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be

operable above the recommended operating conditions and stressing the parts to these levels is not recommended.

In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.

The absolute maximum ratings are stress ratings only.

Symbol

Parameter

Conditions

Min.

Max.

Unit

Supply Voltage

-0.5

4.6

V

-0.5

4.6

DC Input Voltage

I/O Ports A and B

-0.5

4.6

V

Control Input (/OE)

-0.5

4.6

Output Voltage

(2)

Output 3-State

-0.5

4.6

V

-0.5

-0.5

DC Input Diode Current

-50

mA

DC Output Diode Current

-50

mA

+50

DC Output Source/Sink Current

-50

+50

mA

±100

mA

Storage Temperature Range

-65

+150

°C

Power Dissipation

17

mW

ESD

Electrostatic Discharge

Capability

Human Body Model (per JESD22-

A114 & Mil Std 883e 3015.7)

8

kV

Charged Device Model

(per ESD STM 5.3)

2

Notes:

1.

2.

Recommended Operating Conditions

The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended

operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not

recommend exceeding them or designing to Absolute Maximum Ratings.

Symbol

Parameter

Conditions

Min.

Max.

Unit

Power Supply

1.1

3.6

V

Input Voltage

Ports A and B

0

3.6

V

Control Input (/OE)

0

V

Operating Temperature, Free Air

-40

+85

°C

dt/dV

Minimum Input Edge Rate

10

ns/V

Thermal Resistance:

Junction-to-Ambient

UMLP-16

315

°C/W

UMLP-12

300

Thermal Resistance:

Junction-to-Case

UMLP-16

155

°C/W

UMLP-12

165