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AD760AQ Datasheet(PDF) 3 Page - Analog Devices |
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AD760AQ Datasheet(HTML) 3 Page - Analog Devices |
3 / 12 page AD760 REV. A –3– NOTES 1For 18-bit resolution, 1 LSB = 0.00038% of FSR. For 16-bit resolution, 1 LSB = 0.0015% of FSR. For 14-bit resolution, 1 LSB = 0.006% of FSR. FSR stands for full-scale range and is 10 V in unipolar mode and 20 V in bipolar mode. 2Characteristics are guaranteed at V OUT Pin (23). 3T CAL is the calibration temperature. 4Gain Error is measured with a fixed 50 resistor as shown in Figure 5a and Figure 6a. 5Gain Error and gain drift are measured with the internal reference. The internal reference is the main contributor to the gain drift. If lower drift is required, the AD760 can be used with a precision external reference such as the AD587, AD586 or AD688. 6DAC Gain Error is measured without the on-chip voltage reference. It represents the performance that can be obtained with an external precision reference. 7External current is defined as the current available in addition to that supplied to REF IN and SPAN/BIPOLAR OFFSET on the AD760. 8Operation on ±12 V supplies is possible using an external reference such as the AD586 and reducing the output range. Refer to the Internal/External Reference section. Specifications subject to change without notice. AC PERFORMANCE CHARACTERISTICS Parameter Limit Units Test Conditions/Comments Output Settling Time 13 µs max 20 V Step, TA = +25°C (Time to +0.0008% FS, with 8 µs typ 20 V Step, TA = +25°C 2 k , 1000 pF Load) 10 µs typ 20 V Step 6 µs typ 10 V Step, TA = +25°C 8 µs typ 10 V Step 2.5 µs typ 1 LSB Step MUXOUT Recovery Time Recovery time is referenced to the rising edge of CALOK, (Time to +0.0008% FS, with when MUXOUT switches from MUXIN to VOUT. 100 pF Load) MUXIN = VOUT prior to calibration. 2 µs typ MUXIN, VOUT = –10 V to +10 V Total Harmonic Distortion + Noise A, S Grade 0.005 % max 0 dB, 1001 Hz. Sample Rate = 100 kHz. TA = +25°C A, S Grade 0.03 % max –20 dB, 1001 Hz. Sample Rate = 100 kHz. TA = +25°C A, S Grade 3.0 % max –60 dB, 1001 Hz. Sample Rate = 100 kHz. TA = +25°C Signal-to-Noise Ratio 94 dB min TA = +25°C, byte load Digital-to-Analog Glitch Impulse 15 nV-s typ DAC alternately loaded with 8000H and 7FFFH MUXOUT Glitch Impulse 30 nV-s typ 100 pF Load. MUXIN = VOUT = negative full scale Digital Feedthrough 2 nV-s typ DAC alternately loaded with 0000H and FFFFH. CS high Output Noise Voltage Density (1 kHz–1 MHz) 120 nV/ Hz typ Measured at VOUT, 20 V span, excludes internal reference Reference Noise (1 kHz–1 MHz) 125 nV/ Hz typ Measured at REF OUT Specifications are subject to change without notice. With the exception of Total Harmonic Distortion + Noise and Signal-to-Noise Ratio, these characteristics are included for design guidance only and are not subject to test. THD+N and SNR are 100% tested. (TMIN < TA < TMAX, VCC = +15 V, VEE = –15 V, VLL = +5 V, tested at VOUT except where noted.) |
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