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AD9281ARS Datasheet(PDF) 5 Page - Analog Devices |
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AD9281ARS Datasheet(HTML) 5 Page - Analog Devices |
5 / 19 page AD9281 –5– REV. E DRVDD AVSS DRVSS DRVSS AVDD AVDD AVSS AVSS AVDD REFBS REFBF AVDD AVSS AVDD AVSS AVDD AVSS AVDD AVSS IN AVDD AVSS AVSS AVDD AVDD AVSS AVDD AVSS d. INA, INB e. Reference f. REFSENSE g. VREF Figure 2. Equivalent Circuits OFFSET ERROR The first transition should occur at a level 1 LSB above “zero.” Offset is defined as the deviation of the actual first code transi- tion from that point. OFFSET MATCH The change in offset error between I and Q channels. EFFECTIVE NUMBER OF BITS (ENOB) For a sine wave, SINAD can be expressed in terms of the num- ber of bits. Using the following formula, N = (SINAD – 1.76)/6.02 It is possible to get a measure of performance expressed as N, the effective number of bits. Thus, effective number of bits for a device for sine wave inputs at a given input frequency can be calculated directly from its measured SINAD. TOTAL HARMONIC DISTORTION (THD) THD is the ratio of the rms sum of the first six harmonic com- ponents to the rms value of the measured input signal and is expressed as a percentage or in decibels. SIGNAL-TO-NOISE RATIO (SNR) SNR is the ratio of the rms value of the measured input signal to the rms sum of all other spectral components below the Nyquist frequency, excluding the first six harmonics and dc. The value for SNR is expressed in decibels. SPURIOUS FREE DYNAMIC RANGE (SFDR) The difference in dB between the rms amplitude of the input signal and the peak spurious signal. GAIN ERROR The first code transition should occur for an analog value 1 LSB above nominal negative full scale. The last transition should occur for an analog value 1 LSB below the nominal positive full scale. Gain error is the deviation of the actual difference be- tween first and last code transitions and the ideal difference between the first and last code transitions. GAIN MATCH The change in gain error between I and Q channels. PIPELINE DELAY (LATENCY) The number of clock cycles between conversion initiation and the associated output data being made available. New output data is provided every rising clock edge. MUX SELECT DELAY The delay between the change in SELECT pin data level and valid data on output pins. POWER SUPPLY REJECTION The specification shows the maximum change in full scale from the value with the supply at the minimum limit to the value with the supply at its maximum limit. APERTURE JITTER Aperture jitter is the variation in aperture delay for successive samples and is manifested as noise on the input to the A/D. APERTURE DELAY Aperture delay is a measure of the Sample-and-Hold Amplifier (SHA) performance and is measured from the rising edge of the clock input to when the input signal is held for conversion. SIGNAL-TO-NOISE AND DISTORTION (S/N+D, SINAD) RATIO S/N+D is the ratio of the rms value of the measured input sig- nal to the rms sum of all other spectral components below the Nyquist frequency, including harmonics but excluding dc. The value for S/N+D is expressed in decibels. a. D0–D9 b. Three-State Standby c. CLK |
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