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LM25018 Datasheet(PDF) 4 Page - Texas Instruments |
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LM25018 Datasheet(HTML) 4 Page - Texas Instruments |
4 / 18 page LM25018 SNVS953 – DECEMBER 2012 www.ti.com Electrical Characteristics Specifications with standard typeface are for TJ = 25°C, and those with boldface type apply over full Operating Junction Temperature range. VIN = 48V, unless otherwise stated. See (1). Symbol Parameter Conditions Min Typ Max Units VCC Supply VCC Reg VCC Regulator Output VIN = 48V, ICC = 20mA 6.25 7.6 8.55 V VCC Current Limit VIN = 48V (2) 26 mA VCC Undervoltage Lockout Voltage 4.15 4.5 4.9 V (VCC Increasing) VCC Undervoltage Hysteresis 300 mV VCC Drop Out Voltage VIN = 9V, ICC = 20mA 2.3 V IIN Operating Current Non-Switching, FB = 3V 1.75 mA IIN Shutdown Current UVLO = 0V 50 225 µA Switch Characteristics Buck Switch RDS(ON) ITEST = 200mA, BST-SW = 0.8 1.8 Ω 7V Synchronous RDS(ON) ITEST = 200mA 0.45 1 Ω Gate Drive UVLO VBST − VSW Rising 2.4 3 3.6 V Gate Drive UVLO Hysteresis 260 mV Current Limit Current Limit Threshold 390 575 750 mA Current Limit Response Time Time to Switch Off 150 ns Off-Time Generator (Test 1) FB = 0.1V, VIN = 48V 12 µs Off-Time Generator (Test 2) FB = 1V, VIN = 48V 2.5 µs On-Time Generator TON Test 1 VIN = 32V, RON = 100k 270 350 460 ns TON Test 2 VIN = 48V, RON = 100k 188 250 336 ns TON Test 4 VIN = 10V, RON = 250k 1880 3200 4425 ns Minimum Off-Time Minimum Off-Timer FB = 0V 144 ns Regulation and Overvoltage Comparators FB Regulation Level Internal reference trip point 1.2 1.225 1.25 V for switch ON FB Overvoltage Threshold Trip point for switch OFF 1.62 V FB Bias Current 60 nA Undervoltage Sensing Function UV Threshold UV Rising 1.19 1.225 1.26 V UV Hysteresis Input Current UV = 2.5V -10 -20 –29 µA Remote Shutdown Threshold Voltage at UVLO Falling 0.32 0.66 V Remote Shutdown Hysteresis 110 mV Thermal Shutdown Tsd Thermal Shutdown Temp. 165 °C Thermal Shutdown Hysteresis 20 °C Thermal Resistance Junction to Ambient PSOP-8 40 °C/W θJA LLP-8 40 °C/W (1) All electrical characteristics having room temperature limits are tested during production at TA = 25°C. All hot and cold limits are specified by correlating the electrical characteristics to process and temperature variations and applying statistical process control. (2) VCC provides self bias for the internal gate drive and control circuits. Device thermal limitations limit external loading. 4 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: LM25018 |
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