TPS65281

SW_OUT

AGND

nFAULT

EN_SW

PGND

VIN

V7V

EN

VIN

5V

+3.3V

USB Data

Enable

USB fault signal

C2

1uF

C7

47nF

C1

10uF

C4

10uF

R5

100kΩ

C3

4.7nF

C5

22uF

R1

10kΩ

13

14

15

16

8

7

6

5

USB control signal

L1

4.7uH

R2

20kΩ

USB

Port

R3

40.2kΩ

R4

12.7kΩ

C6

4.7nF

TPS65281

SW_OUT

AGND

nFAULT

EN_SW

PGND

VIN

V7V

EN

VIN

6V~18V

+5V

USB Data

Enable

USB fault signal

C2

1uF

C7

47nF

C1

10uF

C4

10uF

R5

100kΩ

C3

4.7nF

C5

22uF

R1

10kΩ

13

14

15

16

8

7

6

5

USB control signal

L1

4.7uH

R2

20kΩ

USB

Port

R3

40.2kΩ

R4

7.68kΩ

C6

4.7nF

TPS65281, TPS65281-1

www.ti.com

SLVSBH7B – JULY 2012 – REVISED DECEMBER 2012

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

TYPICAL APPLICATION

Figure 1. 12-V Power Bus

Figure 2. 5-V Power Bus

Copyright © 2012, Texas Instruments Incorporated

Submit Documentation Feedback

3

Product Folder Links: TPS65281 TPS65281-1