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SMDB05V Datasheet(PDF) 9 Page - Seoul Semiconductor |
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SMDB05V Datasheet(HTML) 9 Page - Seoul Semiconductor |
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9 / 19 page  APCPCWM_4828539:WP_0000001WP_0000001 Rev. 00 Rev. 00 October, 2012 October, 2012 www.acrich.com www.acrich.com Document No. : QP-7-07-18 (Rev.00) 공통_을 [ [9 9 /19] /19] Item Symbol Condition Criteria for Judgement MIN MAX Forward Voltage V F I F =20mA - I.V. *1 × 1.2 Luminous Intensity I V I F =20mA I.V. × 0.7 - Note : *1 I.V. : Initial Value *2 U.S.L : Upper Standard Level * Criteria for Judging the Damage 5. Reliability Test * TEST ITEMS AND RESULTS Item Reference Test Condition Duration / Cycle Number of Damage Life Test - T a = 25 ℃, I F = 20mA 1,000 Hours 0/20 High Temperature Life Test - T a = 85 ℃, I F = 5mA 1,000 Hours 0/20 Low Temperature Life Test - T a = -30 ℃, I F = 20mA 1,000 Hours 0/20 High Humidity Heat Life Test JEITA ED-4701 100 102 T a = 60 ℃, RH = 90%, I F = 20mA 500 Hours 0/20 High Temperature Storage JEITA ED-4701 200 201 T a = 100 ℃ 1,000 Hours 0/20 Low Temperature Storage JEITA ED-4701 200 202 T a = -40 ℃ 1,000 Hours 0/20 Temperature Cycle JEITA ED-4701 100 105 -40℃ ~ 25℃ ~ 100℃ ~ 25℃ (30min) (5min) (30min) (5min) 100 cycle 0/50 |
Similar Part No. - SMDB05V |
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Similar Description - SMDB05V |
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