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100323PC Datasheet(PDF) 3 Page - Fairchild Semiconductor |
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100323PC Datasheet(HTML) 3 Page - Fairchild Semiconductor |
3 / 6 page 3 www.fairchildsemi.com Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum rating. The “Recommended Operating Conditions” table will define the conditions for actual device operation. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. DC Electrical Characteristics (Note 3) VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = 0°C to +85°C Note 3: The specified limits represent “worst case” values for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho- sen to guarantee operation under “worst case” conditions. DIP AC Electrical Characteristics (Note 4) VEE = −4.2V to −5.7V, VCC = VCCA = GND Note 4: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guard banding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho- sen to guarantee operation under “worst case” conditions. PLCC AC Electrical Characteristics (Note 5) VEE = −4.2V to −5.7V, VCC = VCCA = GND Note 5: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guard banding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho- sen to guarantee operation under “worst case” conditions. Storage Temperature −65°C to +150°C Maximum Junction Temperature +150°C VEE Pin Potential to Ground Pin −7.0V to +0.5V Input Voltage (DC) VEE to +0.5V Output Current (DC Output High) −50 mA ESD ≥2000V Case Temperature 0 °C to +85°C Supply Voltage (VEE) −5.7V to −4.2V Symbol Parameter Min Typ Max Units Conditions VIH Input HIGH Voltage −1165 −870 mV Guaranteed High Signal for ALL Inputs VIL Input LOW Voltage −1830 −1475 mV Guaranteed Low Signal for ALL Inputs VOH Output HIGH Voltage −1025 −955 −870 mV VIN = VIH (max) or VIL (min) Loading with 25Ω to −2.0V VOHC Output HIGH Voltage −1035 mV VIN = VIH (min) or VIL (max) Loading with 25Ω to −2.0V VOLZ Cut-Off LOW Voltage −1950 mV VIN = VIH (min) or VIL (max) Loading with 25Ω to −2.0V IIL Input LOW Current 0.50 µAV IN = VIL (min) IIH Input HIGH Current 240 µAV IN = VIH (max) IEE Power Supply Current −121 −91 −57 mA Inputs Open Symbol Parameter TC = 0°CTC = +25°CTC = +85°C Units Conditions Min Max Min Max Min Max tPZH Propagation Delay 1.90 3.60 1.90 3.60 2.00 3.80 ns Figures 1, 2 tPHZ Data to Output 1.30 2.70 1.30 2.70 1.50 2.70 tPZH Propagation Delay 1.90 3.60 1.90 3.60 2.00 3.90 ns tPHZ Dual Enable to Output 1.60 3.00 1.60 3.00 1.70 3.40 tPZH Propagation Delay 1.80 3.50 1.80 3.50 2.00 3.80 ns tPHZ Common Enable to Output 1.50 2.90 1.50 2.90 1.60 3.00 tTZH Transition Time 0.50 1.80 0.50 1.80 0.50 1.80 ns tTHZ 20% to 80%, 80% to 20% 0.35 1.40 0.35 1.40 0.35 1.40 Symbol Parameter TC = 0°CTC = +25°CTC = +85°C Units Conditions Min Max Min Max Min Max tPZH Propagation Delay 1.90 3.40 1.90 3.40 2.00 3.60 ns Figures 1, 2 tPHZ Data to Output 1.30 2.50 1.30 2.50 1.50 2.70 tPZH Propagation Delay 1.90 3.40 1.90 3.40 2.00 3.70 ns tPHZ Dual Enable to Output 1.60 2.80 1.60 2.80 1.70 3.00 tPZH Propagation Delay 1.80 3.30 1.80 3.30 2.00 3.60 ns tPHZ Common Enable to Output 1.50 2.70 1.50 2.70 1.60 2.80 tTZH Transition Time 0.50 1.70 0.50 1.70 0.50 1.70 ns tTHZ 20% to 80%, 80% to 20% 0.35 1.30 0.35 1.20 0.35 1.30 |
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