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EPM7128STC100-15N Datasheet(PDF) 25 Page - Altera Corporation |
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EPM7128STC100-15N Datasheet(HTML) 25 Page - Altera Corporation |
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25 / 66 page  Altera Corporation 25 MAX 7000 Programmable Logic Device Family Data Sheet Design Security All MAX 7000 devices contain a programmable security bit that controls access to the data programmed into the device. When this bit is programmed, a proprietary design implemented in the device cannot be copied or retrieved. This feature provides a high level of design security because programmed data within EEPROM cells is invisible. The security bit that controls this function, as well as all other programmed data, is reset only when the device is reprogrammed. Generic Testing Each MAX 7000 device is functionally tested. Complete testing of each programmable EEPROM bit and all internal logic elements ensures 100% programming yield. AC test measurements are taken under conditions equivalent to those shown in Figure 10. Test patterns can be used and then erased during early stages of the production flow. Figure 10. MAX 7000 AC Test Conditions QFP Carrier & Development Socket MAX 7000 and MAX 7000E devices in QFP packages with 100 or more pins are shipped in special plastic carriers to protect the QFP leads. The carrier is used with a prototype development socket and special programming hardware available from Altera. This carrier technology makes it possible to program, test, erase, and reprogram a device without exposing the leads to mechanical stress. f For detailed information and carrier dimensions, refer to the QFP Carrier & Development Socket Data Sheet. 1 MAX 7000S devices are not shipped in carriers. VCC To Test System C1 (includes JIG capacitance) Device input rise and fall times < 3 ns Device Output 464 Ω [703 Ω] 250 [8.06 ] Ω K Ω Power supply transients can affect AC measurements. Simultaneous transitions of multiple outputs should be avoided for accurate measurement. Threshold tests must not be performed under AC conditions. Large-amplitude, fast ground-current transients normally occur as the device outputs discharge the load capacitances. When these transients flow through the parasitic inductance between the device ground pin and the test system ground, significant reductions in observable noise immunity can result. Numbers in brackets are for 2.5-V devices and outputs. Numbers without brackets are for 3.3-V devices and outputs. |
Similar Part No. - EPM7128STC100-15N |
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Similar Description - EPM7128STC100-15N |
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