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ADT7411ARQZ-REEL1 Datasheet(PDF) 9 Page - Analog Devices |
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ADT7411ARQZ-REEL1 Datasheet(HTML) 9 Page - Analog Devices |
9 / 36 page ADT7411 Rev. B | Page 9 of 36 TERMINOLOGY Relative Accuracy Relative accuracy or integral nonlinearity (INL) is a measure of the maximum deviation, in LSBs, from a straight line passing through the endpoints of the ADC transfer function. A typical INL vs. code plot can be seen in Figure 10. Total Unadjusted Error (TUE) Total unadjusted error is a comprehensive specification that includes the sum of the relative accuracy error, gain error, and offset error under a specified set of conditions. Offset Error This is a measure of the offset error of the ADC. It can be negative or positive. It is expressed in mV. Gain Error This is a measure of the span error of the ADC. It is the deviation in slope of the actual ADC transfer characteristic from the ideal expressed as a percentage of the full-scale range. Offset Error Drift This is a measure of the change in offset error with changes in temperature. It is expressed in ppm of full-scale range/°C. Gain Error Drift This is a measure of the change in gain error with changes in temperature. It is expressed in ppm of full-scale range/°C. Long-Term Temperature Drift This is a measure of the change in temperature error with the passage of time. It is expressed in degrees Celsius. The concept of long-term stability has been used for many years to describe by what amount an IC’s parameter would shift during its lifetime. This is a concept that has been typically applied to both voltage references and monolithic temperature sensors. Unfortunately, ICs cannot be evaluated at room temperature (25°C) for 10 years or so to determine this shift. As a result, manufacturers typically perform accelerated lifetime testing of ICs by operating ICs at elevated temperatures (between 125°C and 150°C) over a shorter period (typically between 500 hours and 1,000 hours). Because of this operation, the lifetime of an IC is significantly accelerated due to the increase in rates of reaction within the semiconductor material. DC Power Supply Rejection Ratio (PSRR) The power supply rejection ratio (PSRR) is defined as the ratio of the power in the ADC output at full-scale frequency f to the power of a 100 mV sine wave applied to the VDD supply of frequency fs. PSRR (dB) = 10 log(Pf/Pfs) where: Pf is the power at frequency f in ADC output. Pfs is the power at frequency fs coupled into the VDD supply. Round Robin This term describes the ADT7411 cycling through the available measurement channels in sequence, taking a measurement on each channel. |
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