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BQ76PL536A-Q1 Datasheet(PDF) 8 Page - Texas Instruments

Part # BQ76PL536A-Q1
Description  3 to 6 Series Cell Lithium-Ion Battery Monitor and Secondary Protection IC for EV and HEV Applications
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

BQ76PL536A-Q1 Datasheet(HTML) 8 Page - Texas Instruments

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bq76PL536A-Q1
SLUSAM3
– MAY 2011
www.ti.com
HOST INTERFACE
Typical values stated where TA = 25°C and VBAT = 20 V, Min/Max values stated where TA = –40°C to 105°C and VBAT = 7.2 V
to 27 V (unless otherwise noted)
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
Logic-level output voltage, high; SDO_H, FAULT_H,
VOH
CL = 20 pF, IOH < 5 mA
(1)
4.5
VLDOD
V
ALERT_H, DRDY
Logic-level output voltage, low; SDO_H, FAULT_H,
VOL
CL = 20 pF, IOL < 5 mA
(1)
VSS
0.5
V
ALERT_H, DRDY
Logic-level input voltage, high; SCLK_H, SDI_H, CS_H,
VIH
2
5.2
V
CONV
Logic-level input voltage, low; SCLK_H, SDI_H, CS_H,
VIL
VSS
0.8
V
CONV
CIN
Input capacitance SCLK_H, SDI_H, CS_H, CONV
5
pF
ILKG
Input leakage current SCLK_H, SDI_H, CS_H, CONV
1
µA
(1)
Total simultaneous current drawn from all pins is limited by LDOD current to
≤10 mA.
GENERAL PURPOSE INPUT/OUTPUT (GPIO)
Typical values stated where TA = 25°C and VBAT = 20 V, Min/Max values stated where TA = –40°C to 105°C and VBAT = 7.2 V
to 27 V (unless otherwise noted)
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
VIH
Logic-level input voltage, high
Vin
≤ VREG50
2
V
VIL
Logic-level input voltage, low
0.8
V
VOH
Output high-voltage pullup voltage
Supplied by external ~100-k
Ω resistor
VREG50
V
VOL
Logic-level output voltage, low
IOL = 1 mA
0.3
V
CIN
Input capacitance(1)
5
pF
ILKG
Input leakage current
1
µA
CELL BALANCING CONTROL OUTPUT (CBx)
Typical values stated where TA = 25°C and VBAT = 20 V, Min/Max values stated where TA = –40°C to 105°C and VBAT = 7.2 V
to 27 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
CBz
Output impedance
1 V
< VCELL < 5 V
80
100
120
k
Ω
VRANGE
Output V
VCn-1
VCn
V
ANALOG-TO-DIGITAL CONVERTER
ADC Common Specifications
Typical values stated where TA = 25°C and VBAT = 20 V, Min/Max values stated where TA = –40°C to 105°C and VBAT = 7.2 V
to 27 V (unless otherwise noted)
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
ADC_CONTROL[ADC_ON] = 1
5.4
6
6.6
µs
tCONV_START
CONV high to conversion start(1) (2)
ADC_CONTROL[ADC_ON] = 0
500
µs
tCONV
Conversion time per selected channel(3)
ADC_CONTROL[ADC_ON] = 1
5.4
6
6.6
µs
ILKG
Input leakage current
Not converting
<10
100
nA
(1)
If ADC_CONTROL[ADC_ON] = 0, add 500
µs to conversion time to allow ADC subsystem to stabilize. This is self-timed by the part.
(2)
Additional 50 ms (POR) is required before first conversion after a) initial cell connection; or b) VBAT falls below VPOR.
(3)
Plus tCONV_START, i.e., if device is programmed for six channel conversions, total time is approximately 6 × 6 + 6 = 42 µs.
8
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Copyright
© 2011, Texas Instruments Incorporated
Product Folder Link(s): bq76PL536A-Q1


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