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STM32L152VB Datasheet(PDF) 98 Page - STMicroelectronics |
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STM32L152VB Datasheet(HTML) 98 Page - STMicroelectronics |
98 / 121 page Electrical characteristics STM32L151x6/8/B, STM32L152x6/8/B 98/121 Doc ID 17659 Rev 8 Figure 30. 12-bit buffered /non-buffered DAC 1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the DAC_CR register. 6.3.18 Temperature sensor characteristics 4. Difference between measured value at Code i and the value at Code i on a line drawn between Code 0 and last Code 4095. 5. Difference between the value measured at Code (0x800) and the ideal value = VREF+/2. 6. Difference between the value measured at Code (0x001) and the ideal value. 7. Difference between ideal slope of the transfer function and measured slope computed from code 0x000 and 0xFFF when buffer is OFF, and from code giving 0.2 V and (VDDA – 0.2) V when buffer is ON. 8. In buffered mode, the output can overshoot above the final value for low input code (starting from min value). R LOAD C LOAD Buffered/Non-buffered DAC DAC_OUTx Buffer(1) 12-bit digital to analog converter ai17157V2 Table 58. Temperature sensor characteristics Symbol Parameter Min Typ Max Unit TL (1) 1. Guaranteed by characterization, not tested in production. VSENSE linearity with temperature ±1 ±2°C Avg_Slope(1) Average slope 1.48 1.61 1.75 mV/°C V110 Voltage at 110°C ±5°C(2) 2. Measured at VDD = 3 V ±10 mV. V110 ADC conversion result is stored in the TSENSE_CAL2 byte. 612 626.8 641.5 mV IDDA(TEMP) (3) Current consumption 3.4 6 µA tSTART (3) 3. Guaranteed by design, not tested in production. Startup time 10 µs TS_temp (4)(3) 4. Shortest sampling time can be determined in the application by multiple iterations. ADC sampling time when reading the temperature 10 |
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