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FM93C56LN Datasheet(PDF) 4 Page - Fairchild Semiconductor

Part # FM93C56LN
Description  (MICROWIRE??Bus Interface) 2048-Bit Serial EEPROM with Data Protect and Sequential Read
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Manufacturer  FAIRCHILD [Fairchild Semiconductor]
Direct Link  http://www.fairchildsemi.com
Logo FAIRCHILD - Fairchild Semiconductor

FM93C56LN Datasheet(HTML) 4 Page - Fairchild Semiconductor

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FM93CS56 Rev. C.1
Absolute Maximum Ratings (Note 1)
Ambient Storage Temperature
-65
°C to +150°C
All Input or Output Voltages
+6.5V to -0.3V
with Respect to Ground
Lead Temperature
(Soldering, 10 sec.)
+300
°C
ESD rating
2000V
Operating Conditions
Ambient Operating Temperature
FM93CS56L/LZ
0
°C to +70°C
FM93CS56LE/LZE
-40
°C to +85°C
FM93CS56LV/LZV
-40
°C to +125°C
Power Supply (V
CC)
2.7V to 5.5V
DC and AC Electrical Characteristics V
CC = 2.7V to 4.5V unless otherwise specified. Refer to
page 3 for V
CC = 4.5V to 5.5V.
Symbol
Parameter
Conditions
Min
Max
Units
I
CCA
Operating Current
CS = V
IH, SK=256 KHz
1
mA
I
CCS
Standby Current
CS = V
IL
L
10
µA
LZ (2.7V to 4.5V)
1
µA
I
IL
Input Leakage
V
IN = 0V to VCC
±1
µA
IOL
Output Leakage
(Note 2)
V
IL
Input Low Voltage
-0.1
0.15V
CC
V
V
IH
Input High Voltage
0.8V
CC
V
CC +1
V
OL
Output Low Voltage
I
OL = 10µA
0.1V
CC
V
V
OH
Output High Voltage
I
OH = -10µA
0.9V
CC
f
SK
SK Clock Frequency
(Note 3)
0
250
KHz
tSKH
SK High Time
1
µs
t
SKL
SK Low Time
1
µs
tCS
Minimum CS Low Time
(Note 4)
1
µs
t
CSS
CS Setup Time
0.2
µs
t
PRES
PRE Setup Time
50
ns
tDH
DO Hold Time
70
ns
t
PES
PE Setup Time
50
ns
tDIS
DI Setup Time
0.4
µs
t
CSH
CS Hold Time
0
ns
t
PEH
PE Hold Time
250
ns
tPREH
PRE Hold Time
50
ns
t
DIH
DI Hold Time
0.4
µs
tPD
Output Delay
2
µs
t
SV
CS to Status Valid
1
µs
t
DF
CS to DO in Hi-Z
CS = V
IL
0.4
µs
tWP
Write Cycle Time
15
ms
Capacitance T
A = 25°C, f = 1 MHz or 256
KHz (Note 5)
Symbol
Test
Typ
Max
Units
C
OUT
Output Capacitance
5
pF
CIN
Input Capacitance
5
pF
Note 1:
Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage
to the device. This is a stress rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of the specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect device reliability.
Note 2:
Typical leakage values are in the 20nA range.
Note 3:
The shortest allowable SK clock period = 1/fSK (as shown under the fSK parameter). Maximum
SK clock speed (minimum SK period) is determined by the interaction of several AC parameters stated
in the datasheet. Within this SK period, both tSKH and tSKL limits must be observed. Therefore, it is not
allowable to set 1/fSK = tSKHminimum + tSKLminimum for shorter SK cycle time operation.
Note 4:
CS (Chip Select) must be brought low (to VIL) for an interval of tCS in order to reset all internal
device registers (device reset) prior to beginning another opcode cycle. (This is shown in the opcode
diagram on the following page.)
Note 5:
This parameter is periodically sampled and not 100% tested.
AC Test Conditions
V
CC Range
V
IL/VIH
V
IL/VIH
V
OL/VOH
I
OL/IOH
Input Levels
Timing Level
Timing Level
2.7V
≤ V
CC ≤ 5.5V
0.3V/1.8V
1.0V
0.8V/1.5V
±10µA
(Extended Voltage Levels)
4.5V
≤ V
CC ≤ 5.5V
0.4V/2.4V
1.0V/2.0V
0.4V/2.4V
2.1mA/-0.4mA
(TTL Levels)
Output Load: 1 TTL Gate (C
L = 100 pF)


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