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SI4012-C1001AT Datasheet(PDF) 5 Page - Silicon Laboratories |
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SI4012-C1001AT Datasheet(HTML) 5 Page - Silicon Laboratories |
5 / 50 page Si4012 Rev 1.1 5 Table 3. Si4012 RF Transmitter Characteristics1 (TA = 25 °C, VDD = 3.3 V, RL = 550 , unless otherwise noted) Parameter Test Condition Min Typ Max Unit Frequency Range (FRF)2 27 — 960 MHz Frequency Noise (rms)3 Allen deviation, measured across 1ms interval —0.3 — ppm Phase Noise @ 915 MHz 10 kHz offset — –70 — dBc/Hz 100 kHz offset — –100 — dBc/Hz 1 MHz offset — –105 — dBc/Hz Frequency Tuning Time — 5 — ms Carrier Frequency Accuracy 0 °C ≤ TA ≤ 70 °C –150 +150 ppm –40 °C ≤ TA ≤ 85 °C –250 +250 ppm Frequency Error Contribution with External Crystal –10 — +10 ppm Transmit Power4 Maximum programmed Tx power, with optimum differential load, VDD > 2.2 V — 10 — dBm Minimum programmed TX power, with optimum differential load, VDD > 2.2 V — –13 — dBm Power variation vs temp and supply, with optimum differential load, VDD >2.2 V –1.0 — 0.5 dB Power variation vs temp and supply, with optimum differential load, VDD >1.8 V –2.5 — 0.5 dB Transmit power step size from –13 to 6.5 dBm —0.25 — dB PA Edge Ramp Rate Programmable Range OOK mode 0.34 — 10.7 us Data Rate OOK 0.1 — 50 kbaud FSK 0.1 — 100 kbaud FSK Deviation Max frequency deviation — 275 — ppm Deviation resolution — 2 — ppm Deviation accuracy ±(4 ppm + 2% pk-pk target FSK deviation in ppm) ppm OOK Modulation Depth 60 — — dB Antenna Tuning Capacitive Range (Differential) 315 MHz 2.4 — 12.5 pF Notes: 1. All specifications guaranteed by production test unless otherwise noted. Production test conditions and max limits are listed in "1.1. Definition of Test Conditions" on page 7. 2. The frequency range is continuous over the specified range. 3. The frequency step size is limited by the frequency noise. 4. Optimum differential load is equal to 4 V/(11.5 mA/2 x 4/PI) = 550 Therefore the antenna load resistance in parallel with the Si4012 differential output resistance should equal 600 |
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