Over-current

caused by

transient

Wake-Up Pulse

from Master Node

Over-current

caused by fault

condition

EN = H, TX = L

EN = H, TX = H

CQ

RX

WAKE

CUR_OK

CQ

RX

WAKE

CUR_OK

80 s ± 5 s

m

m

< 45 s

m

< 45 s

m

CQ

RX

WAKE

CUR_OK

CQ

RX

WAKE

CUR_OK

80 s ± 5 s

m

m

t WAKE

P

t WAKE

P

> 250 s

m

CQ

RX

WAKE

CUR_OK

CQ

RX

WAKE

CUR_OK

> 250 s

m

t SC

P

t SC

P

SN65HVD101

SN65HVD102

SLLSE84A – MAY 2011 – REVISED MARCH 2013

www.ti.com

Figure 7. Over-Current and Wake Conditions

Current Limit Indication, Short Circuit Current Detection

If the output current at CQ remains at the internally set current limit IO(LIM) for a duration longer than a wake-up

pulse (longer than 80 usec) the CUR_OK pin will be driven to a logic LOW state. The CUR_OK pin will return to

the high-impedance (inactive) state when the CQ pin is no longer in a current limit condition.

The state diagram shown in Figure 8 illustrates the various states and under what conditions the device

transitions from one state to another.

10

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