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CAT34C02VP2I-G4 Datasheet(PDF) 3 Page - ON Semiconductor |
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CAT34C02VP2I-G4 Datasheet(HTML) 3 Page - ON Semiconductor |
3 / 14 page CAT34C02 http://onsemi.com 3 Table 5. A.C. CHARACTERISTICS (VCC = 1.7 V to 5.5 V, TA = −40°C to +85°C) (Note 6) Symbol Parameter Standard Fast Units Min Max Min Max FSCL Clock Frequency 100 400 kHz tHD:STA START Condition Hold Time 4 0.6 ms tLOW Low Period of SCL Clock 4.7 1.3 ms tHIGH High Period of SCL Clock 4 0.6 ms tSU:STA START Condition Setup Time 4.7 0.6 ms tHD:DAT Data Hold Time 0 0 ms tSU:DAT Data Setup Time 250 100 ns tR (Note 7) SDA and SCL Rise Time 1000 300 ns tF (Note 7) SDA and SCL Fall Time 300 300 ns tSU:STO STOP Condition Setup Time 4 0.6 ms tBUF Bus Free Time Between STOP and START 4.7 1.3 ms tAA SCL Low to SDA Data Out 3.5 0.9 ms tDH Data Out Hold Time 100 100 ns Ti (Note 7) Noise Pulse Filtered at SCL and SDA Inputs 100 100 ns tSU:WP WP Setup Time 0 0 ms tHD:WP WP Hold Time 2.5 2.5 ms tWR Write Cycle Time 5 5 ms tPU (Notes 7 & 8) Power−up to Ready Mode 1 1 ms 6. Test conditions according to “A.C. Test Conditions” table. 7. Tested initially and after a design or process change that affects this parameter. 8. tPU is the delay between the time VCC is stable and the device is ready to accept commands. Table 6. THERMAL CHARACTERISTICS (Air velocity = 0 m/s, 4 layers PCB) (Notes 9 and 10) Part Number Package qJA qJC Units CAT34C02Y TSSOP 64 37 °C/W CAT34C02VP2 TDFN 92 15 °C/W CAT34C02HU3 UDFN 101 18 °C/W CAT34C02HU4 UDFN 101 18 °C/W 9. TJ = TA + PD * qJA, where: TJ is the Junction Temperature, TA the Ambient Temperature, PD the Power dissipation. Example: CAT34C02VP2, VCC = 3.0 V, ICCmax = 1 mA, TA = 85°C: TJ = 85°C + 3 mW * 92°C/W = 85.276°C. 10.TJ = TC + PD * qJC, where: TC is the Case Temperature, etc. Table 7. A.C. TEST CONDITIONS Input Levels 0.2 VCC to 0.8 VCC Input Rise and Fall Times ≤ 50 ns Input Reference Levels 0.3 VCC, 0.7 VCC Output Reference Levels 0.5 VCC Output Load Current Source: IOL = 3 mA (VCC ≥ 2.5 V); IOL = 1 mA (VCC < 2.5 V); CL = 100 pF |
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