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ACPL-M61L-060E Datasheet(PDF) 8 Page - AVAGO TECHNOLOGIES LIMITED

Part # ACPL-M61L-060E
Description  Ultra Low Power 10 MBd Digital CMOS Optocouplers
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Manufacturer  AVAGO [AVAGO TECHNOLOGIES LIMITED]
Direct Link  http://www.avagotech.com
Logo AVAGO - AVAGO TECHNOLOGIES LIMITED

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8
Switching Specifications (AC)
Over the recommended temperature (TA = –40°C to +105°C) and supply voltage (2.7 V ≤ VDD ≤ 5.5 V). All typical speci-
fications are at VDD = 5 V, TA = 25°C.
Parameter
Symbol
Min
Typ
Max
Units
Test Conditions
Propagation Delay Time
to Logic Low Output [1]
tPHL
46
80
ns
IF = 2 mA, VI = 5 V, RT = 1.68 kΩ,
CL = 15 pF, CMOS Signal Levels.
IF = 2 mA, VI = 3.3 V, RT = 870 Ω,
CL = 15 pF, CMOS Signal Levels.
Figure 6,7
Propagation Delay Time
to Logic High Output [1]
tPLH
40
80
ns
Pulse Width
tPW
100
ns
Pulse Width Distortion[2]
PWD
6
30
ns
Propagation Delay Skew [3]
tPSK
30
ns
Output Rise Time
(10% – 90%)
tR
12
ns
IF = 2 mA, VI = 5 V, RT = 1.68 kΩ,
CL = 15 pF, CMOS Signal Levels.
10
ns
IF = 2 mA, VI = 3.3 V, RT = 870 Ω,
CL = 15 pF, CMOS Signal Levels.
Output Fall Time
(90% - 10%)
tF
12
ns
IF = 2 mA, VI = 5 V, RT = 1.68 kΩ,
CL = 15 pF, CMOS Signal Levels.
10
ns
IF = 2 mA, VI = 3.3 V, RT = 870 Ω,
CL = 15 pF, CMOS Signal Levels.
Static Common Mode
Transient Immunity at
Logic High Output [4]
| CMH |
20
35
kV/
μs
VCM = 1000 V, TA = 25°C, IF = 0 mA,
VI = 0 V (RT =1.68 kΩ) or (RT = 870Ω),
CL = 15 pF, CMOS Signal Levels.
Figure 8
Static Common Mode
Transient Immunity at
Logic Low Output [5]
| CML |
20
35
kV/
μs
VCM = 1000 V, TA = 25°C, VI = 5 V
(RT = 1.68 kΩ) or VI = 3.3 V
(RT = 870Ω), IF = 2 mA, CL= 15 pF,
CMOS Signal Levels.
Figure 8
Dynamic Common Mode
Transient Immunity [6]
CMRD
35
kV/
μs
VCM = 1000 V, TA = 25°C, IF = 2 mA,
VI = 5 V (RT = 1.68 kΩ) or VI = 3.3 V
(RT = 870Ω), 10MBd datarate,
the absolute increase of PWD < 10ns
Figure 8
Notes:
1. tPHL propagation delay is measured from the 50% (Vin or IF) on the rising edge of the input pulse to the 50% VDD of the falling edge of the VO signal.
tPLH propagation delay is measured from the 50% (Vin or IF) on the falling edge of the input pulse to the 50% level of the rising edge of the VO
signal.
2. PWD is defined as |tPHL - tPLH|.
3. tPSK is equal to the magnitude of the worst case difference in tPHL and/or tPLH that will be seen between units at any given temperature within the
recommended operating conditions.
4. CMH is the maximum tolerable rate of rise of the common mode voltage to assure that the output will remain in a high logic state.
5. CML is the maximum tolerable rate of fall of the common mode voltage to assure that the output will remain in a low logic state.
6. CMD is the maximum tolerable rate of the common mode voltage during data transmission to assure that the absolute increase of the PWD is less
than 10 ns.
Package Characteristics
All typicals are at TA = 25°C.
Parameter
Symbol
Part Number
Min
Typ
Max
Units
Test Conditions
Input-Output Insulation
VISO
ACPL-064L
ACPL-M61L
3750
Vrms
RH < 50% for 1 min.
TA = 25°C
ACPL-W61L
ACPL-K64L
5000
Input-Output Resistance
RI-O
1012
VI-O = 500 V
Input-Output Capacitance
CI-O
0.6
pF
f = 1 MHz, TA = 25°C


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