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74FCT2543ATSOCTE4 Datasheet(PDF) 4 Page - Texas Instruments |
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74FCT2543ATSOCTE4 Datasheet(HTML) 4 Page - Texas Instruments |
4 / 14 page CY74FCT2543T 8-BIT LATCHED TRANSCEIVER WITH 3-STATE OUTPUTS SCCS042C – SEPTEMBER 1994 – REVISED NOVEMBER 2001 4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP† MAX UNIT VIK VCC = 4.75 V, IIN = –18 mA –0.7 –1.2 V VOH VCC = 4.75 V, IOH = –15 mA 2.4 3.3 V VOL VCC = 4.75 V, IOL = 12 mA 0.3 0.55 V Rout VCC = 4.75 V, IOL = 12 mA 20 25 40 W Vhys All inputs 0.2 V IIH VCC 525 V VIN = VCC 5 µA IIH VCC = 5.25 V VIN = 2.7 V ±1 µA IIL VCC = 5.25 V, VIN = 0.5 V ±1 µA IOZH VCC = 5.25 V, VOUT = 2.7 V 15 µA IOZL VCC = 5.25 V, VOUT = 0.5 V –15 µA IOS‡ VCC = 5.25 V, VOUT = 0 V –60 –120 –225 mA Ioff VCC = 0 V, VOUT = 4.5 V ±1 µA ICC VCC = 5.25 V, VIN ≤ 0.2V, VIN ≥ VCC – 0.2 V 0.1 0.2 mA ∆ICC VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open 0.5 2 mA ICCD¶ VCC = 5.25 V, One input switching at 50% duty cycle, Outputs open, CEAB and OEAB = LOW, CEBA = HIGH, VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V 0.06 1.2 mA/ MHz # VCC = 5.25 V, f0 = 10 MHz, One bit switching at f1 = 5 MHz VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V 0.7 1.4 IC# Outputs open, CEAB and OEAB = LOW 1 at 50% duty cycle VIN = 3.4 V or GND 1.2 3.4 mA IC# CEAB and OEAB = LOW, CEBA = HIGH, f0 = LEAB = 10 MHz Eight bits switching at f1 = 5 MHz VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V 2.8 5.6|| mA 0 1 at 50% duty cycle VIN = 3.4 V or GND 5.1 14.6|| Ci 5 10 pF Co 9 12 pF † Typical values are at VCC = 5 V, TA = 25°C. ‡ Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last. § Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND ¶ This parameter is derived for use in total power-supply calculations. # IC = ICC + ∆ICC × DH × NT + ICCD (f0/2 + f1 × N1) Where: IC = Total supply current ICC = Power-supply current with CMOS input levels ∆ICC = Power-supply current for a TTL high input (VIN = 3.4 V) DH = Duty cycle for TTL inputs high NT = Number of TTL inputs at DH ICCD = Dynamic current caused by an input transition pair (HLH or LHL) f0 = Clock frequency for registered devices, otherwise zero f1 = Input signal frequency N1 = Number of inputs changing at f1 All currents are in milliamperes and all frequencies are in megahertz. || Values for these conditions are examples of the ICC formula. |
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