CY74FCT2543T

8-BIT LATCHED TRANSCEIVER

WITH 3-STATE OUTPUTS

SCCS042C – SEPTEMBER 1994 – REVISED NOVEMBER 2001

4

POST OFFICE BOX 655303

electrical characteristics over recommended operating free-air temperature range (unless

otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP†

MAX

UNIT

VIK

VCC = 4.75 V,

IIN = –18 mA

–0.7

–1.2

V

VOH

VCC = 4.75 V,

IOH = –15 mA

2.4

3.3

V

VOL

VCC = 4.75 V,

IOL = 12 mA

0.3

0.55

V

Rout

VCC = 4.75 V,

IOL = 12 mA

20

25

40

W

Vhys

All inputs

0.2

V

IIH

VCC 525 V

VIN = VCC

5

µA

IIH

VCC = 5.25 V

VIN = 2.7 V

±1

µA

IIL

VCC = 5.25 V,

VIN = 0.5 V

±1

µA

IOZH

VCC = 5.25 V,

VOUT = 2.7 V

15

µA

IOZL

VCC = 5.25 V,

VOUT = 0.5 V

–15

µA

IOS‡

VCC = 5.25 V,

VOUT = 0 V

–60

–120

–225

mA

Ioff

VCC = 0 V,

VOUT = 4.5 V

±1

µA

ICC

VCC = 5.25 V,

VIN ≤ 0.2V,

VIN ≥ VCC – 0.2 V

0.1

0.2

mA

∆ICC

VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open

0.5

2

mA

ICCD¶

VCC = 5.25 V, One input switching at 50% duty cycle, Outputs open,

CEAB and OEAB = LOW, CEBA = HIGH,

VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V

0.06

1.2

mA/

MHz

#

VCC = 5.25 V, f0 = 10 MHz,

One bit switching

at f1 = 5 MHz

VIN ≤ 0.2 V or

VIN ≥ VCC – 0.2 V

0.7

1.4

IC#

Outputs open,

CEAB and OEAB = LOW

1

at 50% duty cycle

VIN = 3.4 V or GND

1.2

3.4

mA

IC#

CEAB and OEAB = LOW,

CEBA = HIGH,

f0 = LEAB = 10 MHz

Eight bits switching

at f1 = 5 MHz

VIN ≤ 0.2 V or

VIN ≥ VCC – 0.2 V

2.8

5.6||

mA

0

1

at 50% duty cycle

VIN = 3.4 V or GND

5.1

14.6||

Ci

5

10

pF

Co

9

12

pF

† Typical values are at VCC = 5 V, TA = 25°C.

‡ Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or

sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise, prolonged

shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In any sequence

of parameter tests, IOS tests should be performed last.

§ Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND

¶ This parameter is derived for use in total power-supply calculations.

# IC

= ICC + ∆ICC × DH × NT + ICCD (f0/2 + f1 × N1)

Where:

IC

= Total supply current

ICC

= Power-supply current with CMOS input levels

∆ICC = Power-supply current for a TTL high input (VIN = 3.4 V)

DH

= Duty cycle for TTL inputs high

NT

= Number of TTL inputs at DH

ICCD = Dynamic current caused by an input transition pair (HLH or LHL)

f0

= Clock frequency for registered devices, otherwise zero

f1

= Input signal frequency

N1

= Number of inputs changing at f1

All currents are in milliamperes and all frequencies are in megahertz.

|| Values for these conditions are examples of the ICC formula.