TPS786xx

SLVS389L – SEPTEMBER 2002 – REVISED OCTOBER 2010

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PRODUCT

(2)

TPS786xx yyy z

XX is nominal output voltage (for example, 28 = 2.8 V, 285 = 2.85 V, 01 = Adjustable).

YYY is package designator.

Z is package quantity.

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Output voltages from 1.3 V to 5.0 V in 100-mV increments are available; minimum order quantities may apply. Contact factory for details

and availability.

ABSOLUTE MAXIMUM RATINGS

Over operating temperature (unless otherwise noted)

(1)

VALUE

–0.3 V to 6 V

6 V

Peak output current

Internally limited

ESD rating, HBM

2 kV

ESD rating, CDM

500 V

Continuous total power dissipation

See Thermal Information table

–40°C to +150°C

–65°C to +150°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

2

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