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SN74F112NE4 Datasheet(PDF) 2 Page - Texas Instruments |
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SN74F112NE4 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 13 page SN74F112 DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP WITH CLEAR AND PRESET SDFS048A – D2932, MARCH 1987 – REVISED OCTOBER 1993 2–2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 logic symbol† S 4 1J 3 1J 1K 2 1K R 15 1Q 5 6 C1 1PRE 1CLR 1Q 1 1CLK 10 11 2J 12 2K 14 2Q 9 7 2PRE 2CLR 2Q 13 2CLK † This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. logic diagram, each flip-flop (positive logic) PRE CLK K Q Q CLR J absolute maximum ratings over operating free-air temperature range (unless otherwise noted)‡ Supply voltage range, VCC – 0.5 V to 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input voltage range, VI (see Note 1) – 1.2 V to 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input current range – 30 mA to 5 mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Voltage range applied to any output in the high state – 0.5 V to VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Current into any output in the low state 40 mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Operating free-air temperature range 0 °C to 70°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Storage temperature range – 65 °C to 150°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: The input voltage ratings may be exceeded provided the input current ratings are observed. |
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