2003 Oct 14

7

Philips Semiconductors

Product specification

High speed CAN transceiver

TJA1040

Note

1. All parameters are guaranteed over the virtual junction temperature range by design, but only 100% tested at 125

°C

ambient temperature for dies on wafer level, and in addition to this 100% tested at 25

°C ambient temperature for

cased products; unless specified otherwise. For bare dies, all parameters are only guaranteed with the backside of

the die connected to ground.

recessive output voltage

no load

2

3V

standby mode; no load

−0.1

0

+0.1

V

short-circuit output current

−40

−70

−95

mA

70

100

mA

recessive output current

−2.5

−

+2.5

mA

differential receiver threshold

voltage

normal mode (see Fig.6) 0.5

0.7

0.9

V

standby mode

0.4

0.7

1.15

V

differential receiver hysteresis

voltage

normal mode;

50

70

100

mV

input leakage current

−50

+5

µA

common-mode input

resistance

standby or normal mode

15

25

35

k

Ω

common-mode input

resistance matching

−3

0

+3

%

differential input resistance

standby or normal mode

25

50

75

k

Ω

common-mode input

capacitance

−−

20

pF

differential input capacitance

−−

10

pF

Timing characteristics; see Fig.8

delay TXD to bus active

normal mode

25

70

110

ns

delay TXD to bus inactive

10

50

95

ns

delay bus active to RXD

15

65

115

ns

delay bus inactive to RXD

35

100

160

ns

40

−

255

ns

TXD dominant time-out

300

600

1000

µs

dominant time for wake-up via

bus

standby mode

0.75

1.75

5

µs

delay standby mode to normal

mode

normal mode

5

7.5

10

µs

Thermal shutdown

shutdown junction temperature

155

165

180

°C

SYMBOL

PARAMETER

CONDITIONS

MIN.

TYP.

MAX.

UNIT