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74HC244DB Datasheet(PDF) 9 Page - NXP Semiconductors |
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74HC244DB Datasheet(HTML) 9 Page - NXP Semiconductors |
9 / 18 page 74HC_HCT244 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet Rev. 4 — 24 September 2012 9 of 18 NXP Semiconductors 74HC244; 74HCT244 Octal buffer/line driver; 3-state Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch. Fig 8. Test circuit for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open G Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74HC244 VCC 6ns 15pF, 50 pF 1k open GND VCC 74HCT244 3 V 6 ns 15 pF, 50 pF 1 k open GND VCC |
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