OUT

VDD

VSS

1

3

2

6

4

5

I

IN4

I

IN3

I

IN2

I

DD

V3

V1

V2

7

8

V4

I

IN1

CD

I

CELL

I

V(OUT)

V(VCELL)

OV Condition

≤ 170 ms

V(CD)

CD pin held low

bq294700, bq294701, bq294702

bq294703, bq294704, bq294705

bq294707

www.ti.com

SLUSB15A – SEPTEMBER 2012 – REVISED SEPTEMBER 2013

CUSTOMER TEST MODE

It is possible to reduce test time for checking the overvoltage function by simply shorting the external CD

170 ms.

Figure 13 shows the timing for the Customer Test Mode.

Figure 13. Timing for Customer Test Mode

Figure 14 shows the measurement for current consumption of the product for both VDD and Vx.

Figure 14. Configuration for IC Current Consumption Test

Copyright © 2012–2013, Texas Instruments Incorporated

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