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EEV476M016A9GAA Datasheet(PDF) 9 Page - Kemet Corporation |
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EEV476M016A9GAA Datasheet(HTML) 9 Page - Kemet Corporation |
9 / 16 page 9 © KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com A4002_EEV • 2/21/2014 Surface Mount Aluminum Electrolytic Capacitors – EEV Series, +105ºC • Capacitive reactance predominates at low frequencies • Withincreasingfrequency,capacitivereactanceXc=1/ωC odecreasesuntilitreachestheorderofmagnitudeofelectrolyte resistance R e(A) • Atevenhigherfrequencies,resistanceoftheelectrolytepredominates:Z=R e (A - B) • Whenthecapacitor’sresonancefrequencyisreached(ω 0),capacitiveandinductivereactancemutuallycanceleachother 1/ωC e=ωL,ω0=C√1/LCe • Abovethisfrequency,inductivereactanceofthewindinganditsterminals(XL=Z=ωL)becomeseffectiveandleadstoanincrease in impedance Generallyspeaking,itcanbeestimatedthatC e≈0.01Co. Impedance as a function of frequency (sinusoidal waveform) for different temperature values can be represented as follows (typical values): 0.1 1 10 100 1000 10000 0.1 1 10 100 1000 Z (ohm ) F (KHz) 85°C 20°C 10 µF -40°C R eisthemosttemperature-dependentcomponentofanelectrolyticcapacitorequivalentcircuit.Electrolyteresistivitywilldecreaseif temperature rises. Inordertoobtainalowimpedancevaluethroughoutthetemperaturerange,R e must be as little as possible. However, Re values thataretoolowindicateaveryaggressiveelectrolyte,resultinginashorterlifeoftheelectrolyticcapacitorathightemperatures.A compromisemustbereached. Leakage Current (LC) Duetothealuminumoxidelayerthatservesasadielectric,asmallcurrentwillcontinuetoflowevenafteraDCvoltagehasbeen appliedforlongperiods.Thiscurrentiscalledleakagecurrent. Ahighleakagecurrentflowsafterapplyingvoltagetothecapacitorthendecreasesinafewminutes,e.g.,afterprolongedstorage withoutanyappliedvoltage.Inthecourseofcontinuousoperation,theleakagecurrentwilldecreaseandreachanalmostconstant value. Afteravoltage-freestoragetheoxidelayermaydeteriorate,especiallyathightemperature.Sincetherearenoleakagecurrentsto transportoxygenionstotheanode,theoxidelayerisnotregenerated.Theresultisthatahigherthannormalleakagecurrentwillflow whenvoltageisappliedafterprolongedstorage. Astheoxidelayerisregeneratedinuse,theleakagecurrentwillgraduallydecreasetoitsnormallevel. |
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