PESDXL4UF_G_W_4

© NXP B.V. 2008. All rights reserved.

Product data sheet

Rev. 04 — 28 February 2008

9 of 17

NXP Semiconductors

PESDxL4UF/G/W

Low capacitance unidirectional quadruple ESD protection diode arrays

Fig 8.

ESD clamping test setup and waveforms

006aab138

50

Ω

vertical scale = 200 V/div

horizontal scale = 50 ns/div

unclamped +1 kV ESD voltage waveform

(IEC 61000-4-2 network)

clamped +1 kV ESD voltage waveform

(IEC 61000-4-2 network)

unclamped

−1 kV ESD voltage waveform

(IEC 61000-4-2 network)

clamped

−1 kV ESD voltage waveform

(IEC 61000-4-2 network)

vertical scale = 200 V/div

horizontal scale = 50 ns/div

vertical scale = 5 V/div

horizontal scale = 50 ns/div

GND

GND

GND2

GND1

GND

450

Ω

RG 223/U

50

Ω coax

ESD TESTER

IEC 61000-4-2 network

DIGITIZING

OSCILLOSCOPE

10

×

ATTENUATOR

(1)

DUT

DEVICE

UNDER

TEST

vertical scale = 5 V/div

horizontal scale = 50 ns/div

(1): attenuator is only used for open

socket high voltage measurements

PESD5V0L4UF/G/W

PESD3V3L4UF/G/W