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ADS7863IRGERG4 Datasheet(PDF) 2 Page - Texas Instruments

Part # ADS7863IRGERG4
Description  Dual, 2MSPS, 12-Bit, 2 2 or 3 3 Channel, Simultaneous Sampling ANALOG-TO-DIGITAL CONVERTER
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

ADS7863IRGERG4 Datasheet(HTML) 2 Page - Texas Instruments

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ADS7863
SBAS383E – JUNE 2007 – REVISED JANUARY 2011
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
PRODUCT
PACKAGE-LEAD
PACKAGE DESIGNATOR
ORDERING NUMBER
ADS7863IDBQ
SSOP-24
DBQ
ADS7863IDBQR
ADS7863I
ADS7863IRGET
4×4 QFN-24
RGE
ADS7863IRGER
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
ADS7863
UNIT
Supply voltage, AVDD to AGND
–0.3 to +6
V
Supply voltage, BVDD to BGND
–0.3 to +6
V
Supply voltage, BVDD to AVDD
1.5 × AVDD
V
Analog and reference input voltage with respect to AGND
AGND – 0.3 to AVDD + 0.3
V
Digital input voltage with respect to BGND
BGND – 0.3 to BVDD + 0.3
V
Ground voltage difference |AGND – BGND|
0.3
V
Input current to any pin except supply pins
–10 to +10
mA
Maximum virtual junction temperature, TJ
+150
°C
Human body model (HBM),
±4000
V
JEDEC standard 22, test method A114-C.01, all pins
ESD ratings:
Charged device model (CDM),
±1500
V
JEDEC standard 22, test method C101, all pins
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum rated conditions for extended periods may affect device reliability.
2
Submit Documentation Feedback
Copyright © 2007–2011, Texas Instruments Incorporated
Product Folder Link(s): ADS7863


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