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TLV2544IDRG4 Datasheet(PDF) 1 Page - Texas Instruments

Part # TLV2544IDRG4
Description  Maximum Throughput 200-KSPS Built-In Reference, Conversion Clock and 8횞 FIFO
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

TLV2544IDRG4 Datasheet(HTML) 1 Page - Texas Instruments

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TLV2544, TLV2548
2.7V TO 5.5V, 12BIT, 200KSPS, 4/8CHANNEL, LOW POWER
SERIAL ANALOGTODIGITAL CONVERTERS WITH AUTOPOWERDOWN
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D Maximum Throughput 200-KSPS
D Built-In Reference, Conversion Clock and
8
× FIFO
D Differential/Integral Nonlinearity Error:
±1 LSB
D Signal-to-Noise and Distortion Ratio:
70 dB, fi = 12-kHz
D Spurious Free Dynamic Range: 75 dB,
fi = 12- kHz
D SPI (CPOL = 0, CPHA = 0)/DSP-Compatible
Serial Interfaces With SCLK up to 20-MHz
D Single Wide Range Supply 2.7 Vdc to
5.5 Vdc
D Analog Input Range 0-V to Supply Voltage
With 500 kHz BW
D Hardware Controlled and Programmable
Sampling Period
D Low Operating Current (1.0-mA at 3.3-V,
1.1-mA at 5.5-V With External Ref
D Power Down: Software/Hardware
Power-Down Mode (1
µA Max, Ext Ref),
Autopower-Down Mode (1
µA, Ext Ref)
D Programmable Auto-Channel Sweep
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
SDO
SDI
SCLK
EOC/(INT)
VCC
A0
A1
A2
A3
A4
CS
REFP
REFM
FS
PWDN
GND
CSTART
A7
A6
A5
DW OR PW PACKAGE
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
SDO
SDI
SCLK
EOC/(INT)
VCC
A0
A1
A2
CS
REFP
REFM
FS
PWDN
GND
CSTART
A3
(TOP VIEW)
TLV2548
D OR PW PACKAGE
(TOP VIEW)
TLV2544
description
The TLV2548 and TLV2544 are a family of high performance, 12-bit low power, 3.86
µs, CMOS analog-to-digital
converters (ADC) which operate from a single 2.7-V to 5.5-V power supply. These devices have three digital
inputs and a 3-state output [chip select (CS), serial input-output clock (SCLK), serial data input (SDI), and serial
data output (SDO)] that provide a direct 4-wire interface to the serial port of most popular host microprocessors
(SPI interface). When interfaced with a TI DSP, a frame sync (FS) signal is used to indicate the start of a serial
data frame.
In addition to a high-speed A/D converter and versatile control capability, these devices have an on-chip analog
multiplexer that can select any analog inputs or one of three internal self-test voltages. The sample-and-hold
function is automatically started after the fourth SCLK edge (normal sampling) or can be controlled by a special
pin, CSTART, to extend the sampling period (extended sampling). The normal sampling period can also be
programmed as short (12 SCLKs) or as long (24 SCLKs) to accommodate faster SCLK operation popular
among high-performance signal processors. The TLV2548 and TLV2544 are designed to operate with very low
power consumption. The power-saving feature is further enhanced with software/hardware/autopower-down
modes and programmable conversion speeds. The conversion clock (OSC) and reference are built-in. The
converter can use the external SCLK as the source of the conversion clock to achieve higher (up to 2.8
µs when
a 20 MHz SCLK is used) conversion speed. Two different internal reference voltages are available. An optional
external reference can also be used to achieve maximum flexibility.
The TLV2544C and the TLV2548C are characterized for operation from 0
°C to 70°C. The TLV2544I and the
TLV2548I are characterized for operation from − 40
°C to 85°C.
Copyright
 1999 − 2003, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
On products compliant to MILPRF38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.


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