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LM12454 Datasheet(PDF) 40 Page - Texas Instruments

Part # LM12454
Description  LM12454/LM12458/LM12H458 12-Bit Sign Data Acquisition System with Self-Calibration
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
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LM12454 Datasheet(HTML) 40 Page - Texas Instruments

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LM12454, LM12458, LM12H458
SNAS079A – MAY 2004 – REVISED FEBRUARY 2006
www.ti.com
Improper termination of digital lines. Improper termination can result in energy reflections that build up to
cause overshoot that goes above the supply potential and undershoot that goes below ground. It is never good
to drive a device beyond the supply rails, unless the device is specifically designed to handle this situation, but
the LM12(H)458 is more sensitive to this condition that most devices. Again, if any pin experiences a potential
more than 100 mV below ground or above the supply voltage, even on a fast transient basis, the result could be
erratic operation, missing codes, or a complete malfunction, depending upon how far the input is driven beyond
the supply rails. The clock input is the most sensitive digital one. Generally, a 50
Ω series resistor, located very
close to the signal source, will keep digital lines "clean".
Excessive output capacitance on the digital lines. The current required to charge the capacitance on the
digital outputs can cause noise on the supply bus within the LM12(H)458, causing internal supply "bounce" even
when the external supply pin is pretty stable. The current required to discharge the output capacitance can cause
die ground "bounce". Either of these can cause noise to be induced at the analog inputs, resulting in conversion
errors.
Output capacitance should be limited as much as possible. A series 100
Ω resistor in each digital output line,
located very close to the output pin, will limit the charge and discharge current, minimizing the extent of the
conversion errors.
Improper CS decoding. If address decoder is used, care must be exercised to ensure that no "runt" (very
narrow) pulse is produced on theCS line when trying to address another device or memory. Even sub-
nanosecond spikes on the CS line can cause the chip to be reprogrammed in accordance with what happens to
be on the data lines at the time. The result is unexpected operation. The worst case result is that the device is
put into the "Test" mode and the on-board EEPROM that corrects linearity is corrupted. If this happens, the only
recourse is to replace the device.
40
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Copyright © 2004–2006, Texas Instruments Incorporated
Product Folder Links: LM12454 LM12458 LM12H458


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