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NE650R479A Datasheet(PDF) 2 Page - NEC |
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NE650R479A Datasheet(HTML) 2 Page - NEC |
2 / 8 page Preliminary Data Sheet 2 NE650R479A RECOMMENDED OPERATION LIMITS Characteristics Symbol Test Conditions MIN. TYP. MAX. Unit Drain to Source Voltage VDS 6.0 6.0 V Gain Compression Gcomp 3.0 dB Channel Temperature Tch +125 °C ELECTRICAL CHARACTERISTICS (TA = 25°C, Unless otherwise specified, using NEC standard test fixture.) Characteristics Symbol Test Conditions MIN. TYP. MAX. Unit Saturated Drain Current IDSS VDS = 2.5 V, VGS = 0 V 0.35 A Pinch-off Voltage Vp VDS = 2.5 V, ID = 2 mA –2.5 –0.5 V Gate to Drain Break Down Voltage BVgd Igd = 2 mA 13 V Thermal Resistance Rth Channel to Case 30 50 °C/W Output Power at 1 dB Gain Compression Point PO (1 dB) 26.0 dBm Drain Current ID 140 mA Power Added Efficiency ηadd 45 % Linear Gain Note 1 GL f = 1.9 GHz, VDS = 6.0 V Rg = 30 Ω IDset = 100 mA (RF OFF) Note 2 13.0 14.0 dB Notes 1. Pin = 0 dBm 2. DC performance is 100% testing. RF performance is testing several samples per wafer. Wafer rejection criteria for standard devices is 1 reject for several samples. |
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