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IDT71L016L100PHI Datasheet(PDF) 4 Page - Integrated Device Technology |
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IDT71L016L100PHI Datasheet(HTML) 4 Page - Integrated Device Technology |
4 / 8 page 4 IDT71L016 LOW POWER 3V CMOS STATIC RAM 1 MEG (64K x 16-BIT) COMMERCIAL AND INDUSTRIAL TEMPERATURE RANGES DATA RETENTION CHARACTERISTICS OVER ALL TEMPERATURE RANGES (VLC = 0.2V, VHC = VDD - 0.2V) Symbol Parameter Test Condition Min. Typ. (1) Max. Unit VDR VCC for Data Retention — 1.5 — — V ICCDR Data Retention Current — <1 5 µA tCDR (3) Chip Deselect to Data CS ≥ VHC 0— — ns Retention Time tR (3) Operation Recovery Time tRC (2) —— ns NOTES: 3771 tbl 09 1. TA = +25 °C. 2. tRC = Read Cycle Time. 3. This parameter is guaranteed by device characterization, but is not production tested. AC TEST CONDITIONS Input Pulse Levels GND to 2.5V Input Rise/Fall Times 3ns Input Timing Reference Levels 1.5V Output Reference Levels 1.5V AC Test Load See Figure 1 3771 tbl 09 LOW VDD DATA RETENTION WAVEFORM 3771 drw 05 DATA RETENTION MODE 2.7V 2.7V V DR ≥ 1.5V V IH V IH tR tCDR V DD CS V DR 3771 drw 04 3070 Ω 3150 Ω 50pF* DATAOUT VDD AC TEST LOAD *Including jig and scope capacitance. Figure 1. AC Test Load |
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