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IDT7198S35LB Datasheet(PDF) 2 Page - Integrated Device Technology |
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IDT7198S35LB Datasheet(HTML) 2 Page - Integrated Device Technology |
2 / 8 page 6.4 2 IDT7198S/L CMOS STATIC RAM 64K (16K x 4-BIT) Added Chip Select and Output Enable Controls MILITARY TEMPERATURE RANGE MEMORY CONTROL The IDT7198 64K high-speed CMOS static RAM incorpo- rates two additional memory control features (an extra chip select and an output enable pin) which offer additional ben- efits in many system memory applications. Both chip selects, Chip Select 1 ( CS1) and Chip Select 2 ( CS2), must be LOW to select the memory. If either chip select is pulled HIGH, the memory will be deselected and remain in the standby mode. This dual chip select feature ( CS1, CS2) also brings the convenience of improved system speeds to the large memory designer by reducing the external logic required to perform decoding. PIN DESCRIPTIONS Name Description A0–A13 Address Inputs CS1 Chip Select 1 CS2 Chip Select 2 WE Write Enable OE Output Enable I/O0–I/O3 Data I/O VCC Power GND Ground 2985 tbl 01 TRUTH TABLE (1) Mode CS1 CS CS2 WE WE OE OE I/O Power Standby H X X X High-Z Standby Standby X H X X High-Z Standby Read L L H L DOUT Active Write L L L X DIN Active Read L L H H High-Z Active NOTE: 2985 tbl 02 1. H = VIH, L = VIL, X = don't care. 5 6 7 8 9 10 11 L28-2 26 25 24 23 13 14 15 16 17 32 1 28 27 INDEX A5 A6 A12 A11 A10 CS 12 22 21 A3 A4 2985 drw 03 A7 A8 20 19 18 A9 4 1 A2 A1 A13 NC I/O3 I/O2 I/O1 LCC TOP VIEW PIN CONFIGURATIONS 2985 drw 02 5 6 7 8 9 10 11 12 A0 1 2 3 4 24 23 22 21 20 19 18 17 D24-1 E24-1 A1 A2 A3 A4 A5 A6 A7 A8 CS VCC WE A12 A11 A10 16 15 OE GND A9 A13 1 CS2 16 15 I/O3 I/O2 I/O1 I/O0 DIP/SOJ/CERPACK TOP VIEW ABSOLUTE MAXIMUM RATINGS(1) Symbol Rating Mil. Unit VTERM Terminal Voltage –0.5 to +7.0 V with Respect to GND TA Operating Temperature –55 to +125 °C TBIAS Temperature –65 to +135 °C Under Bias TSTG Storage Temperature –65 to +150 °C PT Power Dissipation 1.0 W IOUT DC Output Current 50 mA NOTE: 2985 tbl 03 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating condi- tions for extended periods may affect reliability. |
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