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IDT71V016SA12PHI8 Datasheet(PDF) 4 Page - Integrated Device Technology |
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IDT71V016SA12PHI8 Datasheet(HTML) 4 Page - Integrated Device Technology |
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4 / 9 page  6.42 4 IDT71V016SA, 3.3V CMOS Static RAM 1 Meg (64K x 16-Bit) Commercial and Industrial Temperature Ranges AC Test Conditions AC Test Loads Figure 3. Output Capacitive Derating Figure 1. AC Test Load Figure 2. AC Test Load (for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ) *Including jig and scope capacitance. +1.5V 50 Ω I/O Z0 =50 Ω 3834 drw 03 30pF 3834 drw 04 320 Ω 350 Ω 5pF* DATA OUT 3.3V 1 2 3 4 5 6 7 20 40 60 80 100 120 140 160 180 200 ∆tAA, tACS (Typical, ns) CAPACITANCE (pF) 8 3834 drw 05 · • • • • • • Input Pulse Levels Input Rise/Fall Times Input Timing Reference Levels Output Reference Levels AC Test Load GND to 3.0V 1.5ns 1.5V 1.5V See Figure 1, 2 and 3 3834 tbl 09 |
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