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AD7628 Datasheet(PDF) 2 Page - Analog Devices

Part # AD7628
Description  CMOS Dual 8-Bit Buffered Multiplying DAC
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

AD7628 Datasheet(HTML) 2 Page - Analog Devices

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TA = –40 CTA = –55 C
Parameter
TA = +25 C
1
to +85 C
to +125 C
1
Units
Test Conditions/Comments
STATIC PERFORMANCE
2
Resolution
8
8
8
Bits
Relative Accuracy
± 1/2
± 1/2
± 1/2
LSB max
This is an Endpoint Linearity Specification
Differential Nonlinearity
± 1
± 1
± l
LSB max
All Grades Guaranteed Monotonic Over
Full Operating Temperature Range
Gain Error
± 2
± 3
± 3
LSB max
Measured Using Internal RFB A and RFB B.
Both DAC Latches Loaded with 11111111.
Gain Error is Adjustable Using Circuits
of Figures 4 and 5.
Gain Temperature Coefficient
3
∆Gain/∆Temperature
± 0.0035
± 0.0035
%/
°C max
Output Leakage Current
OUT A (Pin 2)
± 50
± 200
± 200
nA max
DAC Latches Loaded with 00000000
OUT B (Pin 20)
± 50
± 200
± 200
nA max
Input Resistance (VREFA, VREFB)
88
8k
Ω min
Input Resistance TC = –300 ppm/
°C, Typical
15
15
15
k
Ω max
Input Resistance is 11 k
VREFA/VREFB Input Resistance
Match
± 1
± 1
± 1
% max
DIGITAL INPUTS
4
Input High Voltage (VIH)
2.4
2.4
2.4
V min
Input Low Voltage (VIL)
0.8
0.8
0.8
V max
Input Current (IIN)
± 1
± 10
± 10
µA max
VIN = 0 or VDD
Input Capacitance
DB0–DB7
10
10
10
pF max
WR, CS, DACA/DACB
15
15
15
pF max
SWITCHING CHARACTERISTICS
3
See Timing Diagram
Chip Select to Write Set Up Time (tCS)
160
160
210
ns min
Chip Select to Write Hold Time (tCH)
10
10
10
ns min
DAC Select to Write Set Up Time (tAS)
160
160
210
ns min
DAC Select to Write Hold Time (tAH)
10
10
10
ns min
Data Valid to Write Set Up Time (tDS)
160
160
210
ns min
Data Valid to Write Hold Time (tDH)
10
10
10
ns min
Write Pulse Width (tWR)
150
170
210
ns min
POWER SUPPLY
See Figure 3
IDD, K Grade
2
2
mA
All Digital Inputs VIL or VIH
B, T Grades
2
2.5
2.5
mA
All Digital Inputs VIL or VIH
All Grades
100
500
500
µA
All Digital Inputs 0 V or VDD
Specifications subject to change without notice.
AC PERFORMANCE CHARACTERISTICS
TA = –40 CTA = –55 C
Parameter
TA = +25 C
1
to +85 C
1
to +125
πC1
Units
Test Conditions/Comments
DC SUPPLY REJECTION
(
∆GAIN/∆V
DD)
0.01
0.02
0.02
% per % max
∆V
DD = ± 5%
CURRENT SETTLING TIME
350
400
400
ns max
To 1/2 LSB OutA/OutB Load = 100
Ω.
WR = CS = 0 V.
DB0–DB7 = 0 V to VDD or VDD to 0 V
DIGITAL-TO-ANALOG GLITCH
IMPULSE
330
nV sec typ
For Code Transition 00000000 to 11111111
OUTPUT CAPACITANCE
COUTA
25
25
25
pF max
DAC Latches Loaded with 00000000
COUTB
25
25
25
pF max
COUTA
60
60
60
pF max
DAC Latches Loaded with 11111111
COUTB
60
60
60
pF max
AC FEEDTHROUGH
VREFA to OUT A
–70
–65
–65
dB max
VREFA, VREFB = 20 V p-p Sine Wave
VREFB to OUT B
–70
–65
–65
dB max
@ 10 kHz
CHANNEL-TO-CHANNEL ISOLATION
Both DAC Latches Loaded with 11111111.
VREFA to OUT B
–80
dB typ
VREFA = 20 V p-p Sine Wave @ 10 kHz
VREFB = 0 V See Figure 6.
VREFB to OUTA
–80
dB typ
VREFB = 20 V p-p Sine Wave @ 10 kHz
VREFA = 0 V See Figure 6.
DIGITAL CROSSTALK
60
nV sec typ
Measured for Code Transition 00000000
to 11111111
HARMONIC DISTORTION
–85
dB typ
VIN = 6 V rms @ 1 kHz
NOTES
1Temperature Ranges are K Version; –40
°C to +85°C; B Version; –40°C to +85°C; T Version; –55°C to +125°C.
2Specification applies to both DACs in AD7628.
3Guaranteed by design but not production tested.
4Logic inputs are MOS Gates. Typical input current (+25
°C) is less than 1 nA.
Specifications subject to change without notice.
REV. A
–2–
AD7628–SPECIFICATIONS
(VDD = +10.8 V to +15.75 V, VREF A = VREF B = +10 V; OUT A = OUT B = 0 V unless
otherwise noted)
These characteristics are included for Design Guidance only and are not
subject to test. VDD = +10.8 V to +15.75 V. (Measured Using Recommended PC Board Layout (Figure 7) and AD644 as Output Amplifiers)


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