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AD9387NK Datasheet(PDF) 3 Page - Analog Devices |
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AD9387NK Datasheet(HTML) 3 Page - Analog Devices |
3 / 8 page AD9387NK Rev. 0 | Page 3 of 8 SPECIFICATIONS Table 1. AD9387NKBBCZ-80/AD9387NKBBCZRL-80 Parameter Conditions Temp Test Level1 Min Typ Max Unit DIGITAL INPUTS Input Voltage, High (VIH) Full VI 1.4 3.5 V Input Voltage, Low (VIL) Full VI −0.3 +0.7 V Input Capacitance 25°C VIII 3 pF THERMAL CHARACTERISTICS Thermal Resistance Junction-to-Case BGA (θJC) V 15.2 °C/W Junction-to-Ambient (θJA) V 59 °C/W Ambient Temperature Full V −25 +25 +90 °C DC SPECIFICATIONS Input Leakage Current (IIL) Full VI −10 +10 μA AC SPECIFICATIONS CLK Frequency Full IV 13.5 80 MHz TMDS Output CLK Duty Cycle Full IV 48 52 % Input Data Setup Time Full IV 1 ns Input Data Hold Time Full IV 0.7 ns TMDS Differential Swing VI 900 1000 1100 mV VSYNC and HSYNC Delay from DE Falling Edge IV 1 UI2 VSYNC and HSYNC Delay to DE Rising Edge IV 1 UI2 Differential Output Swing Low-to-High Transition Time 25°C VII 75 175 ps High-to-Low Transition Time 25°C VII 75 175 ps AUDIO AC TIMING Sample Rate I2S and S/PDIF Full IV 32 192 kHz I2S Cycle Time 25°C IV 1 UI2 I2S Setup Time 25°C IV 2 ns I2S Hold Time 25°C IV 2 ns 1 See the section. Explanation of Test Levels 2 UI = unit interval. |
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