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Specifications HCS32MS

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

METHOD

TEST

READ AND RECORD

PRE RAD

POST RAD

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4 (Note 1)

NOTE:

1. Except FN test which will be performed 100% Go/No-Go.

TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS

OPEN

GROUND

1/2 VCC = 3V

± 0.5V

VCC = 6V

± 0.5V

OSCILLATOR

50kHz

25kHz

STATIC BURN-IN I TEST CONNECTIONS (Note 1)

3, 6, 8, 11

1, 2, 4, 5, 7, 9, 10,

12, 13

-14

-

-

STATIC BURN-IN II TEST CONNECTIONS (Note 1)

3, 6, 8, 11

7

-

1, 2, 4, 5, 9, 10, 12,

13, 14

--

DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)

-

7

3, 6, 8, 11

14

1, 2, 4, 5, 9, 10, 12,

13

-

NOTES:

1. Each pin except VCC and GND will have a resistor of 10k

Ω± 5% for static burn-in

2. Each pin except VCC and GND will have a resistor of 1k

Ω± 5% for dynamic burn-in

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V

± 0.5V

3, 6, 8, 11

7

1, 2, 4, 5, 9, 10, 12, 13, 14

NOTE: Each pin except VCC and GND will have a resistor of 47K

Ω± 5% for irradiation testing.

Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.

Spec Number

518768